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- 2013 (2) (entfernen)
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- AFM (1)
- Mechanical properties (1)
- Nanoindenter (1)
- Polymers (1)
Die Verschleißbeträge können im nm-Bereich quantifiziert werden durch die Berechnung eines Mittelwert-Profils.
Grundlage dieser Berechnung ist die hochauflösende Erfassung der 3D-Topographiedaten, die tribologisch beanspruchte
und nichtbeanspruchte Oberflächenbereiche gleichermaßen beinhalten. Ein bestimmtes Messverfahren
(taktil oder optisch) wird nicht favorisiert. Die vertikale Auflösung des Messverfahrens sollte im nm-Bereich
liegen.---------------------------------------------------------------------------------------------------------------------------------------------------------------------
The wear rates can be quantified in the nm range by calculating a mean profile. Based on this calculation is the
high-resolution recording of the 3D topography data containing tribologically worn and unworn surface areas
alike. A specific measurement method (tactile or visual) is not favored. The vertical resolution of the measurement
process should be in the nm range.
Force-deformation curves have been acquired using nanoindentation and atomic force microscopy on two amorphous polymer samples. The shape and size of the indenter tip was characterized using a white light interferometer and AFM. The measured nanoindentation curves were fitted with the Hertz equation to calculate the Young's modulus of the polymers. Once the Young's moduli of the polymers were known, AFM was used to acquire force-distance-curves on the same samples. We also used the Hertz theory for the analysis in this case. As a result, the tip radius of the AFM cantilever tip could be measured.
This procedure is proposed as a method to determine the shape and size of AFM tips for the quantitative characterization of surface forces through force-distance curves.