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Eingeladener Vortrag
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Die Verschleißbeträge können im nm-Bereich quantifiziert werden durch die Berechnung eines Mittelwert-Profils.
Grundlage dieser Berechnung ist die hochauflösende Erfassung der 3D-Topographiedaten, die tribologisch beanspruchte
und nichtbeanspruchte Oberflächenbereiche gleichermaßen beinhalten. Ein bestimmtes Messverfahren
(taktil oder optisch) wird nicht favorisiert. Die vertikale Auflösung des Messverfahrens sollte im nm-Bereich
liegen.---------------------------------------------------------------------------------------------------------------------------------------------------------------------
The wear rates can be quantified in the nm range by calculating a mean profile. Based on this calculation is the
high-resolution recording of the 3D topography data containing tribologically worn and unworn surface areas
alike. A specific measurement method (tactile or visual) is not favored. The vertical resolution of the measurement
process should be in the nm range.
Force-displacement curves have been obtained with a commercial atomic force microscope (AFM) at different temperatures and probe rates on a thick film of poly(n-butyl methacrylate) (PnBMA). The analysis of the force-displacement curves has been focused on the contact portion of the curves, giving information about the stiffness of the sample and its Young's modulus. A novel model of sample deformations that extends the basic equations of the elastic continuum contact theories to the plastic deformations is presented. This model gives several insights into the processes of deformation of soft samples and permits to calculate not only the parameters of the Williams-Landel-Ferry equation but also the Young's modulus and the yielding force of the polymer as a function of temperature and/or probe rate. These quantities have been measured in a wide range of temperatures (70 K) and probe rates (6 decades) for the first time with the AFM, and the results are in very good agreement with measurements performed with customary techniques, such as broadband spectroscopy and dynamic mechanical analysis.
In this article we demonstrate the use of atomic force microscopy (AFM) measurements for the study of macroscopic wear scars. By stitching AFM images acquired over the wear scar, the detailed structure of the scar can be characterized even when the scar is much wider than the typical maximum scan range of the AFM (50–100 µm). The results obtained by AFM are compared with those yielded by white light interferometry (WLI). The comparison validates the WLI measurements; at the same time, it shows decisive differences in the resolutions of these two methods. As a consequence, AFM measurements are necessary whenever a precise characterization of the structure of the scar is required. However, since stitching of AFM images is rather time-consuming, white light interferometry is recommended as a faster method whenever experiments are aimed at just a gross characterization of the scar and the measurement of mean quantities (e.g. the wear volume).
Thin polybutadiene/polystyrene blend films were deposited on glass substrates by spin-coating. The two polymers were chosen, as they are immiscible and differ strongly in their mechanical properties. The blend was characterized with Tapping Mode and force–distance curves. Several advantages of force–distance curves measurements compared to Tapping Mode are shown, most of all the capability of yielding quantitative information about several properties, such as Young's modulus and adhesion. Also the aging behaviour of the blend exposed to air could be observed, in particular the increase of the Young's modulus due to cross-linking and dewetting processes. Additionally, the sample was used to improve the resolution of force–distance curves up to 6 nm, which is to date the best resolution achieved with force–distance curves. Such an improvement resolves the major disadvantage of force–distance curves, compared to other scanning mode, i.e. its inferior resolution.
Poly(methyl methacrylate) (PMMA) surfaces have been modified by dynamic plowing lithography. The resulting modified structures, presenting regions of different densities and stiffnesses, have been studied by forcedisplacement curves. The elasto-plastic response, the stiffness, and the adhesion of the modified samples have been characterized. Forcedisplacement curves are able to distinguish between unmodified PMMA and two different structures resulting from the lithography, i.e. compressed PMMA and low density PMMA. In particular, the low density regions are made up of cluster-like globular particles, whose elasto-plastic response and adhesion are measured and whose contribution to the total elasto-plastic response and to the adhesion has been studied in detail.
Force–distance curves have been acquired with an Atomic Force Microscope on polymethyl methacrylate with embedded glass spheres. The glass spheres provide a stiff substrate with an irregular and complex topography hidden underneath a compliant and even polymer film. This situation is a special case of a mechanical double-layer, which we examined in detail in previous experiments. Up to now uniform and non-uniform polymer films on an even substrate were examined. The film thickness on each point of the sample surface was known and force–distance curves could be averaged in groups according to the film thickness. In this way we were able to develop a semi empirical approach which allows describing the shape of averaged force–distance curves depending on the Youngs moduli of the involved materials and on the film thickness. In this experiment we reconstruct a hidden topography, i.e., we determine the polymer thickness on each point of the sample by analyzing single force–distance curves with our semi empirical equation. The accuracy reached by this approach permits to obtain a reconstruction of the shape and position of the embedded particles limited by a maximum detection depth. Single curves are also analyzed qualitatively in order to locate areas where the adhesion at the polymer/glass interface is weak or the two phases are detached.
Antibiotic resistance is a growing global problem which poses a massive threat to human health. Although human activity contributes to the acceleration of the process, bacteria have a self-driven stabilisation mechanism to protect themselves from such and other external threats: biofilm formation. Nonetheless, it is the adhesion of a single bacterial cell to a surface that triggers the formation of such network of biomolecules and microorganisms, as well as its hazardous consequences. The main objective of this work was to quantify the adhesion force of a single E. coli cell on a Ti substrate via the AFM-related single-cell force spectroscopy, with both the cell and the substrate material being of high clinical relevance. A set of 25 x 25 force displacement curves was acquired with a maximum force of 3.2 nN without dwell time, yielding a topography map and an adhesion force map that showed to be correlated. A mean adhesion force of 0.85 ± 0.175 nN was measured and the presence of cell appendages on the bacterial cell wall was verified through individual force-displacement curves. Bacterial viability was assessed after the measurements via live/dead staining.
Wear test results exhibit often large scattering. Hence, the study of spreading of experimental results requires big datasets.
In various studies, wear coefficients were found to have lognormal distributions. Therefore, it was supposed that the wear coefficient is affected by two normally distributed variables, which combine through a product.
In the present study, we demonstrate that a lognormal distribution may arise from a nonconstant wear coefficient, too, i.e., when a system does not follow Archard’s law.