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Force-distance curves have been acquired with an atomic force microscope on perfluorpolyether films. It is shown that curves acquired on films of different thickness, at different rates and with different dwell times can be overlapped by rescaling the time or distance axis.When the time or distance axis is rescaled,the force depends only on the surface tension of perfluorpolyether and on geometrical properties of thetip (aperture and perimeter of the tip at a given distance from the apex). Hence, curves acquired with thesame tip overlap.
By comparing curves acquired at different rates the dynamics of tip-wetting can be investigated. Fur-thermore, rescaled force-distance curves have been matched with the perimeter of cross sections ofthe tip, i.e. with the perimeter of the three-phase contact line. Such measurements pave the way for anon-destructive investigation of the tip shape.
The topography of wear scars on the surface of a steel disc coated with a diamond-like carbon (DLC) layer has been investigated with an Atomic Force Microscope (AFM). AFM topography images have been combined together taking advantage of the stitching technique for the study of wear scars in their initial stage. Moreover, the topography of the sample has been acquired before and after the sliding tests. In this way even very small changes of the sample surface (<10 nm) can be detected. Three main phenomena taking place at the very initial stage of wear could be identified: the abrasion of small asperities bulging out of the sample surface, the carving of swallow grooves with depth under 20 nm, and the partial or total closure of cavities present on the surface. This last phenomenon shows that, before the carving of a wear scar, the plastic deformation of particular regions of the sample, i.e. the volume around the cavities, takes place already after few cycles (in this case between 400 and 800) in the initial phase of the sliding test.
Forcedisplacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates. Different film thicknesses, from 10 up to 430 nm, were chosen to examine in detail the so called mechanical double-layer topic, i.e., the influence of the substrate on the determination of the mechanical properties of thin films. Taking advantage of the Hertz theory we calculated for all films the contact radius between tip and sample as a function of the applied load. Further Young's modulus of the samples was derived from the experimental data as a function of the applied load and, alternatively, of the deformation. The results of this analysis for 10 different film thicknesses were fitted with several half empirical equations proposed by several researchers. The focus of this work is to evaluate such existing half empirical theories for mechanical double-layers and to show the need for an alternative consistent approach.
Contact-resonance AFM (CR-AFM) has been used in recent years for the measurement of mechanical properties. Compared with other techniques, CR-AFM has a much shorter acquisition time, compensating the incomplete theoretical understanding of the underlying physical phenomena. In the present paper, we propose a procedure, which allows to determine the elastic modulus of the sample as a parameter of the fit of the CR frequency as a function of the load. It is concluded that CR measurements are not appropriate for polymer samples. Major drawbacks are the bad resolution for moduli lower than ca. 10 GPa and the lack of a comprehensive physical model.
Thin polybutadiene/polystyrene blend films were deposited on glass substrates by spin-coating. The two polymers were chosen, as they are immiscible and differ strongly in their mechanical properties. The blend was characterized with Tapping Mode and force–distance curves. Several advantages of force–distance curves measurements compared to Tapping Mode are shown, most of all the capability of yielding quantitative information about several properties, such as Young's modulus and adhesion. Also the aging behaviour of the blend exposed to air could be observed, in particular the increase of the Young's modulus due to cross-linking and dewetting processes. Additionally, the sample was used to improve the resolution of force–distance curves up to 6 nm, which is to date the best resolution achieved with force–distance curves. Such an improvement resolves the major disadvantage of force–distance curves, compared to other scanning mode, i.e. its inferior resolution.
Force–displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates in order to examine the so-called 'mechanical double layer' topic, i.e. the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The hyperbolic fit, a novel semi-empirical equation introduced in previous articles, has been further corroborated. The interpretation of this equation has been deepened, yielding a quantitative and demonstrative characterization of the mechanical properties of double layers. Provided that the Young's moduli of bulk polymer and substrate are measured from the deformation curves, this mathematical model permits to fit the deformationforce curves on the double layers and to determine the thickness of the polymer films in wide range (0200 nm).
In this article we demonstrate the use of atomic force microscopy (AFM) measurements for the study of macroscopic wear scars. By stitching AFM images acquired over the wear scar, the detailed structure of the scar can be characterized even when the scar is much wider than the typical maximum scan range of the AFM (50–100 µm). The results obtained by AFM are compared with those yielded by white light interferometry (WLI). The comparison validates the WLI measurements; at the same time, it shows decisive differences in the resolutions of these two methods. As a consequence, AFM measurements are necessary whenever a precise characterization of the structure of the scar is required. However, since stitching of AFM images is rather time-consuming, white light interferometry is recommended as a faster method whenever experiments are aimed at just a gross characterization of the scar and the measurement of mean quantities (e.g. the wear volume).
Antibiotic resistance is a growing global problem which poses a massive threat to human health. Although human activity contributes to the acceleration of the process, bacteria have a self-driven stabilisation mechanism to protect themselves from such and other external threats: biofilm formation. Nonetheless, it is the adhesion of a single bacterial cell to a surface that triggers the formation of such network of biomolecules and microorganisms, as well as its hazardous consequences. The main objective of this work was to quantify the adhesion force of a single E. coli cell on a Ti substrate via the AFM-related single-cell force spectroscopy, with both the cell and the substrate material being of high clinical relevance. A set of 25 x 25 force displacement curves was acquired with a maximum force of 3.2 nN without dwell time, yielding a topography map and an adhesion force map that showed to be correlated. A mean adhesion force of 0.85 ± 0.175 nN was measured and the presence of cell appendages on the bacterial cell wall was verified through individual force-displacement curves. Bacterial viability was assessed after the measurements via live/dead staining.