Filtern
Erscheinungsjahr
Dokumenttyp
- Zeitschriftenartikel (74) (entfernen)
Sprache
- Englisch (74)
Schlagworte
- Femtosecond laser ablation (17)
- Laser-induced periodic surface structures (LIPSS) (17)
- Femtosecond laser (11)
- Laser ablation (7)
- Laser processing (6)
- Radiation protection (6)
- Silicon (6)
- Laser beam effects (5)
- Laser-induced periodic surface structures (5)
- Double-pulse experiments (4)
- Femtosecond laser processing (4)
- Friction (4)
- High-speed optical techniques (4)
- Nanostructures (4)
- Steel (4)
- Surface functionalization (4)
- Ultrafast optical techniques (4)
- Chalcopyrite (3)
- Laser-induced X-ray emission (3)
- Laser-induced periodic surface structures, LIPSS (3)
- Mach-Zehnder interferometer (3)
- Oxidation (3)
- Silicon compounds (3)
- Surface morphology (3)
- Surface structure (3)
- Titanium (3)
- Tribology (3)
- Ultrashort pulsed laser (3)
- Wear (3)
- Biofilms (2)
- Cell adhesion (2)
- Elemental semiconductors (2)
- Femtosecond laser patterning (2)
- Fluid transport (2)
- Laser-induced x-ray emission (2)
- Light concentration (2)
- Micro solar cells (2)
- Micro-concentrator solar cell (2)
- Niobium (2)
- Optical properties (2)
- Pacemaker (2)
- Photovoltaics (2)
- Polaritons (2)
- Scanning electron microscopy (2)
- Surface plasmons (2)
- Surface texture (2)
- Surface wetting (2)
- Titanium alloy (2)
- Titanium nitride (2)
- Ultrashort laser material interaction (2)
- Ultrashort laser pulses (2)
- (LIPSS) (1)
- Ab initio calculations (1)
- Absorber optimization (1)
- Aluminium (1)
- Amorphization (1)
- Anodic oxidation (1)
- Anodization (1)
- Antibacterial surfaces (1)
- Applications (1)
- Atomic force microscopy (1)
- Auger electron spectroscopy (1)
- Bacterial adhesion (1)
- Bariumalumoborosilicate glass (1)
- Biofilm (1)
- Bioinspiration (1)
- Biomimetic surfaces (1)
- Biomometics (1)
- Bionic materials (1)
- Bug (1)
- CIGSe (1)
- CIGSe micro solar cells (1)
- Conduction bands (1)
- Copper-indium-gallium-diselenide (1)
- Crystallization (1)
- CuInSe2 (1)
- Dentistry (1)
- Dielectrics (1)
- Diffusion (1)
- Editorial (1)
- Electromagnetic scattering (1)
- FS-laser ablation (1)
- Fourier transforms (1)
- Fused silica (1)
- Hard X-ray photoelectron spectroscopy (HAXPES) (1)
- Heat affected zone (1)
- Indium (1)
- Indium islands (1)
- Indium phosphide (1)
- Industrial applications (1)
- LIFT (1)
- Laser Machining (1)
- Laser Processing (1)
- Laser damage (1)
- Laser-induced forward transfer (1)
- Laser-induced forward transfer (LIFT) (1)
- Laser-induced nanostructures (1)
- Laser-induced oxide layer (1)
- Laser-induced periodic surface strctures (LIPSS) (1)
- Laser-modified surface (1)
- Lizard (1)
- Metals (1)
- Michelson interferometer (1)
- Microbial adhesion tests (1)
- Microbial adhesions (1)
- Microconcentrator solar cell (1)
- Molybdenum substrate (1)
- Ophthalmology (1)
- Optical breakdown (1)
- Optical coatings (1)
- Optical microscopy (1)
- Photoelektron spectroscopy (1)
- Physical vapor deposition (1)
- Polarisation (1)
- Polycarbonate (1)
- Polyethylene (1)
- Polymer (1)
- Polymethylmethacrylate (1)
- Protection housing (1)
- Pulse Laser (1)
- Pulse duration (1)
- Refractive index (1)
- Scanning Auger electron microscopy (1)
- Secondary hazard (1)
- Semiconductor (1)
- Semiconductors (1)
- Silica (1)
- Silicon nitride (1)
- Silicon oxide (1)
- Solar cell (1)
- Solid-state plasma (1)
- Spectroscopic imaging ellipsometry (1)
- Superconductivity (1)
- Surface plasmon polariton (1)
- Surface plasmon polaritons (1)
- Surface processing (1)
- Surface superconductivity (1)
- Thin films (1)
- Threshold of silicon (1)
- Ti6Al4V alloys (1)
- Time-of-flight secondary ion mass spectrometry (ToF-SIMS) (1)
- Time-resolved measurements (1)
- Titanium nitride films (1)
- Ultra-short pulse laser processing (1)
- Ultrashort lasers (1)
- Ultrashort pulse laser processing (1)
- X-ray (1)
- X-ray emission (1)
- X-ray emission hazards (1)
- X-ray energies (1)
- X-ray photoelectron spectroscopy (1)
- X-ray spectrum (1)
- lossy materials (1)
- plasmon lifetime (1)
- surface plasmon polaritons (1)
Organisationseinheit der BAM
- 6 Materialchemie (24)
- 6.2 Material- und Oberflächentechnologien (24)
- 6.7 Materialsynthese und Design (3)
- 9 Komponentensicherheit (3)
- 9.5 Tribologie und Verschleißschutz (3)
- 4 Material und Umwelt (2)
- 4.1 Biologische Materialschädigung und Referenzorganismen (2)
- 5 Werkstofftechnik (1)
- 5.1 Mikrostruktur Design und Degradation (1)
- 6.1 Oberflächen- und Dünnschichtanalyse (1)
Paper des Monats
- ja (1)
Laser ablation with femtosecond pulses (130 fs, wavelength 800 nm, repetition rate 2 Hz) was compared with nanosecond-pulse ablation (10 ns, wavelength 266 nm, repetition rate 2.5 Hz) of bariumalumoborosilicate glass in air using the direct focusing technique. Different ablation thresholds and heat-affected zones were observed. The lateral and vertical machining precision was evaluated. Single nanosecond laser pulses in the far UV resulted in a bubble or a circular hole in the centre of the illuminated spot, depending on the applied fluence. The ablation behaviour in the case of near-IR femtosecond pulses contrasted to this. Bubble formation was not detected. It needed repeated pulses at the same spot to modify the surface until material removal could be observed (incubation). Cavity dimensions of less than the beam diameter were achieved in this case.
Ultrashort pulse laser microstructuring (pulse duration 130 fs, wavelength 800 nm, repetition rate 2 Hz) of titanium nitride (TiN) films on silicon substrates was performed in air using the direct focusing technique. The lateral and vertical precision of laser ablation was evaluated. The TiN ablation threshold changed with the number of pulses applied to the surface due to an incubation effect. An ablation depth per pulse below the penetration depth of light was observed. Columnar structures were formed in the silicon substrate after drilling through the TiN layer.
Ablation experiments with ultrashort laser pulses (pulse duration 150 fs, wavelength 800 nm) on polymers (PC, PMMA) relevant for biomedical technology have been performed in air. The lateral and vertical machining precision was evaluated by optical, atomic force and scanning electron microscopy. The ablation threshold reaches values in the range of 0.52.5 J/cm2 and depends significantly on the number of laser pulses applied to the same spot. The hole diameters are influenced by the laser fluence and the number of laser pulses. The relation between the ablation threshold and the number of laser pulses applied to the same spot is described in accordance with an incubation model.
Ablation of indium phosphide wafers in air was performed with low repetition rate ultrashort laser pulses (130 fs, 10 Hz) of 800 nm wavelength. The relationships between the dimensions of the craters and the ablation parameters were analyzed. The ablation threshold fluence depends on the number of pulses applied to the same spot. The single-pulse ablation threshold value was estimated to be fth(1)=0.16 J/cm2. The dependence of the threshold fluence on the number of laser pulses indicates an incubation effect. Morphological and chemical changes of the ablated regions were characterized by means of scanning electron microscopy and Auger electron spectroscopy.
Physical and chemical phenomena resulting from irradiation of silicon and indium phosphide with ultrashort laser pulses (~100fs) were investigated
with respect to the difference between single- and multiple-pulse treatment. In the single-pulse case, several processes were identified: modification,
recrystallization and ablation. All processes exhibit a distinct treshold behaviour. A two photon-absorption coefficient can be determined from a single
spatial ablation profile. Accumulation effects were observed for multi-pulse illumination. Different morphological features like bubbles, rippels and
microcolumns were found.
Multiple pulse investigations of 130-fs Ti:sapphire laser-induced damage of a high reflecting mirror consisting of alternating ?/4-layers of Ta2O5 and SiO2 and a single 500-nm Ta2O5 film were performed. In both cases, fused silica served as the substrate. For a fixed number of 1000 laser pulses per spot, a decrease in the damage threshold fluence of the mirror by a factor of two was observed by changing the repetition rate from 10 Hz to 1 kHz. A single 500-nm Ta2O5 film shows higher damage resistance compared to the mirror. The mirror and the Ta2O5 film samples were partially coated with a 300-nm-thick aluminium layer. The aluminium coating does not influence the damage threshold of the dielectrics underneath.
We investigated the initial modification and ablation of crystalline silicon with single and multiple Ti:sapphire laser pulses of 5 to 400 fs duration. In accordance with earlier established models, we found the phenomena amorphization, melting, re-crystallization, nucleated vaporization, and ablation to occur with increasing laser fluence down to the shortest pulse durations. We noticed new morphological features (bubbles) as well as familiar ones (ripples, columns). A nearly constant ablation threshold fluence on the order of 0.2 J/cm2 for all pulse durations and multiple-pulse irradiation was observed. For a duration of ,100 fs, significant incubation can be observed, whereas for 5 fs pulses, the ablation threshold does not depend on the pulse number within the experimental error. For micromachining of silicon, a pulse duration of less than 500 fs is not advantageous.
The ultrafast laser ablation of silicon has been investigated experimentally and theoretically. The theoretical description is based on molecular dynamics (MD) simulations combined with a microscopic electronic model. We determine the thresholds of melting and ablation for two different pulse durations =20 and 500 fs. Experiments have been performed using 100 Ti:Sap-phire laser pulses per spot in air environment. The ablation thresholds were determined for pulses with a duration of 25 and 400 fs, respectively. Good agreement is obtained between theory and experiment.
The formation of nearly wavelength-sized laser-induced periodic surface structures (LIPSSs) on single-crystalline silicon upon irradiation with single or multiple femtosecond-laser pulses (pulse duration τ=130 fs and central wavelength λ=800 nm) in air is studied experimentally and theoretically. In our theoretical approach, we model the LIPSS formation by combining the generally accepted first-principles theory of Sipe and co-workers with a Drude model in order to account for transient intrapulse changes in the optical properties of the material due to the excitation of a dense electron-hole plasma. Our results are capable to explain quantitatively the spatial periods of the LIPSSs being somewhat smaller than the laser wavelength, their orientation perpendicular to the laser beam polarization, and their characteristic fluence dependence. Moreover, evidence is presented that surface plasmon polaritons play a dominant role during the initial stage of near-wavelength-sized periodic surface structures in femtosecond-laser irradiated silicon, and it is demonstrated that these LIPSSs can be formed in silicon upon irradiation by single femtosecond-laser pulses.
The formation of nearly wavelength-sized laser-induced periodic surface structures (LIPSS) on
single-crystalline silicon upon irradiation with single (N = 1) and multiple (N ≤ 1000) linearly
polarized femtosecond (fs) laser pulses (pulse duration τ = 130 fs, central wavelength λ = 800 nm)
in air is studied experimentally. Scanning electron microscopy (SEM) and optical microscopy are
used for imaging of the ablated surface morphologies, both revealing LIPSS with periodicities close
to the laser wavelength and an orientation always perpendicular to the polarization of the fs-laser
beam. It is experimentally demonstrated that these LIPSS can be formed in silicon upon irradiation
by single fs-laser pulses—a result that is additionally supported by a recent theoretical model.
Two-dimensional Fourier transforms of the SEM images allow the detailed analysis of the
distribution of the spatial frequencies of the LIPSS and indicate, at a fixed peak fluence, a
monotonous decrease in their mean spatial period between ~770 nm (N = 1) and 560 nm (N
= 1000). The characteristic decrease in the LIPSS period is caused by a feedback-mechanism acting
upon excitation of surface plasmon polaritons at the rough silicon surface which is developing under
the action of multiple pulses into a periodically corrugated surface.