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Resistance spot welding is an established joining process for the production of safetyrelevant components in the automotive industry. Therefore, consecutive process monitoring is essential to meet the high quality requirements. Artificial neural networks can be used to evaluate the process parameters and signals, to ensure individual spot weld quality. The predictive accuracy of such algorithms depends on the provided training data set, and the prediction of untrained data is challenging. The aim of this paper was to investigate the extrapolation capability of a multi-layer perceptron model. That means, the predictive performance of the model was tested with data that clearly differed from the training data in terms of material and coating composition. Therefore, three multi-layer perceptron regression models were implemented to predict the nugget diameter from process data. The three models were able to predict the training datasets very well. The models, which were provided with features from the dynamic resistance curve predicted the new dataset better than the model with only process parameters. This study shows the beneficial influence of process signals on the predictive accuracy and robustness of artificial neural network algorithms.
Especially, when predicting a data set from outside of the training space.
In this talk I’ll describe the use of artificial neural networks (ANN) for quantifying X-ray fluorescence (XRF) measurements. The main idea of this talk is to give an overview of the process needed to generate a model that can then be applied to a specific problem.
In XRF, a sample is excited with X-rays and the resulting characteristic radiation is detected to determine elements quantitatively and qualitatively. This is traditionally done in several time-consuming steps. I’ll show the possibilities and problems of using a neural network to realise a "one-click" quantification. This includes generating training data using Monte Carlo simulation and augmenting the existing data set with an ANN to generate more data. The search for the optimal hyperparameters, manually and automatically, is also described. For the case presented, we were able to train a network with a mean absolute error of 0.1% by weight for the synthetic data and 0.7% by weight for a set of experimental data obtained with certified reference materials.
We present a workflow for obtaining fully trained artificial neural networks that can perform automatic particle segmentations of agglomerated, non-spherical nanoparticles from scanning electron microscopy images “from scratch”, without the need for large training data sets of manually annotated images. The whole process only requires about 15 minutes of hands-on time by a user and can typically be finished within less than 12 hours when training on a single graphics card (GPU). After training, SEM image analysis can be carried out by the artificial neural network within seconds. This is achieved by using unsupervised learning for most of the training dataset generation, making heavy use of generative adversarial networks and especially unpaired image-to-image translation via cycle-consistent adversarial networks. We compare the segmentation masks obtained with our suggested workflow qualitatively and quantitatively to state-of-the-art methods using various metrics. Finally, we used the segmentation masks for automatically extracting particle size distributions from the SEM images of TiO2 particles, which were in excellent agreement with particle size distributions obtained manually but could be obtained in a fraction of the time.