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The inspection of complex-shaped components, such as those enabled by additive manufacturing, is a major challenge in industrial quality assurance. A frequently adopted approach to volumetric non-destructive evaluation is X-ray computed tomography, but this has major drawbacks. Two-dimensional radiography can overcome some of these problems, but does not generally provide an inspection that is as capable.
Moreover, designing a detailed inspection for a complex-shaped component is a labour-intensive task, requiring significant expert input. In response, a computational framework for optimizing the data acquisition for an image-based inspection modality has been devised. The initial objective is to advance the capabilities of radiography, but the algorithm is, in principle, also applicable to alternative types of imaging. The algorithm exploits available prior
information about the inspection and simulations of the inspection modality to allow the Determination of the optimal inspection configuration, including specifically component poses with respect to the imaging system. As an intermediate output, spatial maps of inspection performance are computed, for understanding spatially varying limits of detection. Key areas of innovation concern the defect detectability evaluation for arbitrarily complex indications and the creation of an application-specific optimization algorithm. Initial trials of the algorithm are presented, with good results.
This work presents the use of limited experimental measurements to develop a set of calibrated Simulation parameters that can then be used for reliable simulation of subsea pipeline inspections. The modelling software aRTist is used as the simulation tool, and the calibration is through comparison with experimental images of a well characterised sample in a water tank. Image Quality parameters such as signal-to-noise ratio, contrast and basic spatial resolution are compared with the aim of matching simulated values to experimental results. Currently the model is partially calibrated, with signal-to-noise ratio successfully matched while differences are still found in contrast-to-noise ratio comparisons. This means that measurements depending on absolute intensity are not accurate enough in the simulation at this stage. However, the simulation is found to be accurate for wall thickness measurements in tangential images, which are not based on absolute intensity, with simulated and experimental cases producing similar results.
Radiography benchmark 2014
(2015)
The purpose of the 2014 WFNDEC RT benchmark study was to compare predictions of various models of radiographic techniques, in particular those that predict the contribution of scattered radiation. All calculations were carried out for homogenous materials and a mono-energetic X-ray point source in the energy range between 100 keV and 10 MeV. The calculations were to include the best physics approach available considering electron binding effects. Secondary effects like X-ray fluorescence and bremsstrahlung production were to be taken into account if possible. The problem to be considered had two parts. Part I examined the spectrum and the spatial distribution of radiation behind a single iron plate. Part II considered two equally sized plates, made of iron and aluminum respectively, only evaluating the spatial distribution. Here we present the results of above benchmark study, comparing them to MCNP as the assumed reference model. The possible origins of the observed deviations are discussed.
Correctly modeling the continuous photon spectrum of X-ray tubes requires detailed knowledge of the probability distribution of electron properties at the time of X-ray photon creation, in particular electron energy, depth within the target, and direction of movement. Semi-analytical X-ray spectrum models frequently assume a very simplified or even uniform distribution of electron direction. In the case of thick targets and small deviations from normal incidence this is a useful approximation. For thin targets or large deviations from normal incidence the correct distribution of electron directions becomes more important. As calculation speed is an important aspect of semi-analytical models compared to Monte Carlo simulations, fast evaluation of the distribution of electron properties is highly desirable. The approach presented here numerically evaluates the evolution of a discrete probability distribution of electron properties due to single electron scatter interactions within a plane target. This allows capturing the important aspects of the electron distribution while achieving runtimes of a few seconds up to a minute on a standard office PC.
Determining scatter ratios at high energies (> ~ 1MeV) presents challenges not immediately obvious from measurements at conventional X-ray energies. This includes reduced attenuation even in heavy elements as well as a stronger forward bias of scattering. In order to check the reliability of different measurement setups with regard to material thicknesses, distances, and collimation, attenuation and scattering were separately simulated using a Monte Carlo model. The simulation results help in understanding the sources of radiation scattered into the detection area, thereby aiding in eliminating undesired contributions.