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What is meant by ‘Micro Non-Destructive Testing and Evaluation’? This was the central subject of debate in this Special Issue.
At present, sub-millimeter-size components or even assemblies are pervading the industrial and scientific world. Classic examples are electronic devices and watches (as well as parts thereof), but recent examples encompass additively manufactured lattice structures, stents, or other microparts. Moreover, most assemblies contain micro-components. Testing such components or their miniaturized parts would fit well within the topic of micro non-destructive testing and evaluation.
In all cases, performance and integrity testing, quality control, and dimensional tolerances need to be measured at the sub-millimeter level (ideally with a spatial resolution of about a micron); most of the time, such features and components are embedded in much larger assemblies, which also need to be taken into account. The solution to this dilemma (i.e. measuring large parts with high resolution) depends on the part and on the problem under consideration.
Another possible definition of micro non-destructive testing and evaluation can relate to the characterization of micro-features (e.g., the microstructure) in much larger specimens, such as damage in concrete cores or porosity in additively manufactured components. A further aspect is the use of microscopic probes to evaluate macroscopic properties. This is the case, for instance but not at all exclusively, in the use of diffraction techniques to determine macroscopic stress.
The splits between testing and characterization at the micro-level (or of micro parts) from one side and handling of macroscopic assemblies on the other represent a great challenge for many fields of materials characterization. On top of that, including the use of microscopic methods to test integrity would add a further level of complexity.
Imaging, mechanical testing, non-destructive testing, measurement of properties, structural health monitoring, and dimensional metrology all need to be re-defined if we want to cope with the multi-faceted topic of micro non-destructive testing and evaluation.
The challenge has already been accepted by the scientific and engineering communities for a while but is still far from being universally tackled. This Special Issue yields an interesting answer to the questions posed above. It presents the progress made and the different aspects of the challenge as well as at indicates the paths for the future of NDT&E.
Advanced Pulse Laser Machining Technology is a rapidly growing field to tailor special industrial and scientific applications. This is significantly driven by the availability of high-repetition rate laser sources and novel beam delivery concepts.
This Special Issue focuses on developments in areas of surface and volume laser material processing, including spatial and temporal beam shaping, Bessel-beam dicing, direct laser interference patterning (DLIP), laser-induced forward transfer (LIFT), pulse burst machining, waveguide writing, and two-photon polymerization. Additionally, limitations of modern laser processing caused by failure of laser optics or unwanted secondary hazards like X-ray emission are addressed.
Here, we would like to attract contributors from industry and academics. This Special Issue shall bundle original research and review articles of the latest achievements.
Die BAM-Liste ist Grundlage für die stoffbezogenen Baumusterzulassungen für Tankcontainer zur Beförderung gefährlicher Güter durch die BAM und kann darüber hinaus bei der Zulassung von Tankfahrzeugen als Erkenntnisquelle Verwendung finden. Sie dient weiterhin als Nachschlagewerk bei der stoffbezogenen Bewertung von sonstigen Gefahrgutumschließungen.
Diese synoptische Darstellung der Tankanforderungen für die Beförderung gefährlicher Güter basiert auf den in der Datenbank TANKSAFE der BAM gespeicherten Daten. Die Daten spiegeln den neuesten Stand der Sicherheitstechnik auf diesem Gebiet wieder. Sie sind schon seit Jahren Grundlage bei der Erteilung von Baumusterzulassungen für Tankcontainer durch die BAM.