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Unsaturated carbon species at polymer surfaces: The potential of X-ray absorption spectroscopy
(2001)
The use of duplex stainless steels (DSS) in energy related applications is well known. Nowadays, DSS steels become more favorable than austenitic steels due to the outstanding mechanical properties, the good corrosion resistance and the lower nickel content. However, the use of the duplex grade in acidic environments such as seawater often leads to severe degradation of the structural integrity of the steel by hydrogen-induced/assisted cracking (HAC) phenomena, which can eventually result in premature failure. Hydrogen assisted degradation and cracking of steels are active fields of research even though this topic is intensively studied for more than a century. A bottleneck is the analytical validation of the theoretical models proposed ion the literature at the sub-micron scale.
Industrial and the research communities see a need for an accurate analytical method by which it is possible to image the distribution of hydrogen in the microstructure of a steels or and other alloys. Among the very few available methods hydrogen imaging methods, Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) has the principal capability for mapping of hydrogen in a steel’s microstructure. The combination of ToF-SIMS with multivariate data analysis (MVA), electron microscopy (SEM) and electron-backscattered diffraction (EBSD) is a powerful approach for providing chemical and structural information. The use of data fusion techniques has been shown recently to enhance the better understanding of the hydrogen induced degradation processes in in a DSS steel.
The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1 xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too.
BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013.
Surface chemical analysis - Determination of lateral resolution and sharpness in beam-based methods
(2012)
Surface Analysis
(2008)
Summaries of achievements and future activities of the CCQM Surface Analysis Working Group (SAWG)
(2013)
Research and Standardisaton Efforts in Surface Characterisation at BAM in Support of New Technology
(2013)
The proposed ISO Technical Report provides a description of a variety of physical methods of analytical chemistry by which bacteria and biofilms can be analysed. The state of the art, sample requirements and strengths associated with each method are identified. Presented at the DIN-meeting for NA 062-08-16 AA „Chemische Oberflächenanalyse und Rastersondenmikroskopie“
Die Präsentation gibt einen Überblick über die verschiedenen Aktivitäten der BAM im Bereich der Nanotechnologie mit den Schwerpunkten Nanopartikel und Nanosicherheit. Es wird sowohl die Transportsicherheit, als auch die Sicherheit von Batterien mit Nanopartikeln angesprochen. Verschiedene BAM-Projekte zum Thema Nano werden vorgestellt, beginnend mit relevanten REFOPlanprojekten über die Erstellung der OECD nanoTG110 bis hin zu EU-Projekten zur Standardisierung von Messungen an Nanomaterialien, hier insbesondere AEROMET, NanoDefine, NanoValid und EC4SafeNano.
Following the 2017 meeting, progress with the Key Comparison CCQM-K153 related to the BET specific surface lead by UNIIM and the Pilot Study P-190 “Thickness Measurement of nm HfO2 Films” lead by KRISS will be discussed.
The 16th meeting of SAWG will focus on
•survey on CMC claims submitted with reference to K-129 and K-136.
•the overall and SAWG specific aspects of the CCQM Strategy process,
•a consideration of comparisons on convention methods as recommended by the CCQM Plenary Meeting 2017,
•the 2019 CCQM Workshop and paper(s) for Metrologia’s Special Issue,
•discussion of future comparisons.
CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references.
Originally initiated by Dr Martin P Seah, NPL, the Surface Analysis Working Group (SAWG) has been formally founded in 2003. The following terms of reference were presented to CCQM in April 2002. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference:
- to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis;
- to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis;
- to establish and update a work plan to be adopted by CCQM;
- to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology.
Following the 2016 meeting, the Key Comparison K-129 "Measurement of atomic fractions in Cu(In,Ga)Se2 Films" lead by KRISS and the Key Comparison K-136 on "BET specific surface area of nanoporous Al2O3" lead by UNIIM&BAM have been finished in 2016.
The 15th meeting of SAWG will focus on
- survey on CMC claim submitted with reference to K-129 and K-136.
- the overall and SAWG specific aspects of the CCQM Strategy process,
- a joint meeting with the Inorganic Working Group addressing number concentrations of nano particles,
- discussion of future comparisons.
The SAWG was established as an ad-hoc working group in 2003 before being established as a permanent working group. The first comparison was in 2007. Dr Unger recalled the terms of reference for the group, which paralleled those of the CCQM itself, with a focus on spatially resolved chemical surface analysis at the micro- and nano-scale. The group also had a remit to act as a forum for exchange of information on research and development of surface analysis, establish contact with relevant stakeholders and promote the development of SI traceable chemical surface measurements. The group currently had participants from 18 institutes, although five had not sent participants to recent meetings.
Reporting progress on studies, Dr Unger said that P-190CCQM-K-157 (measurement of HfO2 in thin film) had been completed, and the subsequent K-157 approved is ongoing and that for CCQM-K153 (Measurement of Specific Adsorption of N2 and Kr on nonporous SiO2 at liquid nitrogen temperature by BET) was at the draft B was completed stageand distributed to CCQM WG chairpersons for approval.
Dr Unger reported that CCQM-K-153 had covered measurement of specific absorption of nitrogen or krypton on nonporous silica at liquid nitrogen [ambient] temperature. This included an application of the BET method, a standard method for determination of surface area. This fitted into the ‘nonporous’ region of the SAWG measurement space, which included microporous, mesoporous and microporous regions. Of these regions, CCQM-K136 and CCQM-K153 demonstrated capability in meso- and microporous media respectively. CCQM-K153 involved two measurands; amount of absorbed gas at liquid nitrogen temperature, expressed as specific absorption, and the BET surface area. Specific absorption could in principle be traceable to the SI; BET was operationally defined. Five institutes participated. A detailed uncertainty budget was available for both measurands. Results had been excellent, with all laboratories agreeing well within their uncertainties and all in agreement with the reference value.
Reporting on CCQM P190, Dr Unger described the study objective measurand (amount of substance of HfO2 in a thin film), samples and methods. After showing transmission electron microscope images obtained in the study, he briefly reviewed the conclusions. The study identified a need to handle carbon contamination, harmonise the XPS measurement protocol, determine emission angle and identify a consensus value for attenuation length. These conclusions had informed the design of the proposed ongoing K157 study approved at the 24th Meeting of te CCQM.
The group planned a number of comparisons for the next three years:
2019: A pilot study on the amount of substance in a thin organic layer (previously approved).
2020: CCQMK-157, Measurement of the amount of substance of HfO2; A Key comparison on specific gas adsorption on microporous samples and a Pilot study on Homogeneous surface composition of an ionic liquid.
2021: A key comparison measuring the amount of substance in a thin organic layer.
Dr Unger additionally described a recently proposed pilot study to examine chemical composition in a deep nanoscale layer. This was important for the electronics industry. Four participants had expressed interest. The measurand will be the amount of Ir(ppy)2(acac) in a thin organic layer within an organic layer stack on a silicon substrate. He also reported that SAWG had started work on characterisation of graphene material grown by chemical vapour decomposition (CVD). The work would examine coverage on the substrate, number of layers, level of disorder, uncertainty budgets associated with the measurement, and data analysis. A link to VAMAS Technical Work Area 41 “Graphene and Related 2D Materials“ would also be established.
Looking forward, Dr Unger said the group had established a task group on application of Raman spectroscopy. This had important applications but was currently seen as qualitative. He presented the terms of reference for the task group for approval by the CCQM.
Dr Unger reviewed the SAWG activities that have progressed the state of the art in measurement science. He listed the past and ongoing comparisons that had addressed new and challenging measurement problems, and drew attention to a number of key publications in surface analysis. He additionally described stakeholder engagement activities, including collaboration with VAMAS, input to ISO TC 201, contributions to Euramet projects, and contributions to two recent stakeholder workshops.
CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. The Surface Analysis Working Group (SAWG) has been formally founded in 2003. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference:
- to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis;
- to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis;
- to establish and update a work plan to be adopted by CCQM;
- to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology.
Following the 2015 meeting of the CCQM, the pilot study CCQM-P130 “WD and ED Electron Probe Micro Analysis on Au-Cu alloys” lead by BAM&NIST has been finalized. The Key Comparison K-129 “Measurement of atomic fractions in Cu(In,Ga)Se2 Films” lead by KRISS has made substantial progress and is about to be finalized. The new Key Comparison K-136 on “BET specific surface of ” lead by UNIIM&BAM has made strong progress in 2015 and will be finished in 2016.
Metrology for Nano-Analysis: Establishing Reference Methods for Characterizing Nano-Materials
(2013)
Graphene is a two-dimensional carbon network with unique properties, including high mechanical stiffness, strength, and elasticity, outstanding electrical and thermal conductivity, and many others. Despite these advantages, its low solubility, poor reactivity and the limited accessibility of a well-defined basal plane are major challenges for applications. An ideal method to overcome these problems is the covalent attachment of functional molecules to its surface which enables further reactive modifications for specific applications. There is a number of different technologies for surface functionalization of graphene and related CNT materials. However, to get control on the functionalization process and to optimize the performance of the modified surfaces analytical tools for surface chemical characterization are required. X-ray absorption (NEXAFS) and photoelectron spectroscopy (XPS) have been identified to be rather powerful here. Specifically NEXAFS spectroscopy underpinned by quantum chemical spectrum simulations is unique in a way to address changes of aromaticity and defect formation at the graphene surface during functionalization.
For relevant surface modification technologies, we present examples on how NEXAFS and XPS can perform well. All presented modifications aim on the production of platforms for defined functional 2D nanomaterials, as for example multifunctional hybrid architectures. In detail, we investigated:
• Graphene and carbon nanotube functionalized by a Vacuum-Ultraviolet (VUV) induced photochemical process in NH3 or O2 atmospheres in order to introduce amino or hydroxy functionalities, respectively.
• Br bonding on r.f. cw low pressure plasma brominated graphite surfaces by using Br2 and bromoform as plasma gases.
• A wet chemical method for covalent functionalization of graphene sheets by a one-pot nitrene [2+1] cycloaddition reaction under mild conditions. Here a reaction between 2,4,6-trichloro-1,3,5-triazine and sodium azide with thermally reduced graphene oxide (TRGO) results in defined dichlorotriazine-functionalized graphene sheets.
Reference-free XRF is a SI traceable technique for the
determination of the mass deposition (mass per unit area) of elements in films on the nano- and micro scale. The method is radiometrically calibrated instrumentation (PTB@BESSY II, Germany) and based on reliable knowledge of all relevant atomic fundamental, experimental and instrumental parameters. No calibration sample or reference materials are necessary. The approach had been validated in the CCQM-P140 pilot study and the K129 key comparison by determination of mole fractions in Cu(In,Ga)Se2 thin films.
Safe innovation & sustainable production with MNMs need that we:
Understand risks and benefits (diagnostic, assessment)
Identify and implement risk reduction strategies (manage)
Communicate on residual risks (acceptance)
Huge knowledge on characterization, hazards, diagnostic (science)
Little effective use of it for operational risk management (expertise)
Objectives of the centre:
Bridge the gap between research and application (public, private),
Bridge the gap between knowledge on risks and risk management,
Balance between Science and Appliance,
in a sustainable way:
Efficient & Sustainable structure
Collective, harmonized, shared expertise
EU scale, internationally connected.