Filtern
Erscheinungsjahr
- 2004 (154) (entfernen)
Dokumenttyp
Sprache
- Englisch (116)
- Deutsch (35)
- Mehrsprachig (3)
Referierte Publikation
- ja (154) (entfernen)
Schlagworte
- Calcium phosphate ceramics (3)
- Cell-biomaterial interactions (3)
- Explosionsgrenzen (3)
- FIB (3)
- Friction (3)
- Glass (3)
- Human bone-derived cells (3)
- In situ hybridization (3)
- Polystyrene (3)
- XPS (3)
Im Rahmen eines gemeinschaftlichen Projektes der Stahl- und Automobilindustrie wurden für 17 Stahlfeinbleche des Automobilbaus in verschiedenen Anlieferungs- und Verformungszuständen unter -40°C, Raumtemperatur und +100°C mit 37 Versuchsreihen Anrisswöhlerlinien und zügige bzw. zyklische Spannung-Dehnung-Kurven bestimmt. Sämtliche Versuchspunkte, Hysteresen und ermittelte zyklische Kennwerte liegen in einer Datenbank vor. Eine Korrelationen zwischen den Kennwerten aus dem Zugversuch und den Kennwerten aus den zyklischen, dehnungsgeregelten Versuchen ist grundsätzlich möglich.
High-accuracy film thickness measurements in the range below 100 nm can be made by various complex methods like spectral ellipsometry (SE), scanning force microscopy (SFM), grazing incidence X-ray reflectometry (GIXR), or X-ray fluorescence analysis (XRF). The measurement results achieved with these methods are based on different interactions between the film and the probe. A key question in nanotechnology is how to achieve consistent results on a level of uncertainty below one nanometre with different techniques.
Two different types of thickness standards are realised. Metal film standards for X-ray techniques in the thickness range 10 to 50 nm are calibrated by GIXR with monochromatised synchrotron radiation of 8048 eV. The results obtained at four different facilities show excellent agreement. SiO2 on Si standards for SE and SFM in the thickness range 6 to 1000 nm are calibrated by GIXR with monochromatised synchrotron radiation of 1841 eV and with a metrological SFM. Consistent results within the combined uncertainties are obtained with the two methods. Surfaces and interfaces of both types of standards are additionally investigated by transmission electron microscopy (TEM).
Characterization of the fcc/bcc orientation relationship by EBSD using pole figures and variants
(2004)
The orientation relationship (OR) between fcc and bcc lattices are described by crystallographic fundamentals using the example of Kurdjumov-Sachs (K-S) and Nishiyama-Wassermann (N-W). Complete pole figures containing all variants will be used to distinguish even between slightly different ORs. EBSD on iron meteorites and duplex steel has been used to analyse a large number of crystal orientations with regard to a high statistical significance and a high probability to capture all variants in a single measurement. It is shown that the use of fixed OR models like K-S, N-W, Bain, Pitsch, or Greninger-Troiano does not satisfacturally reflect the observed experimental pole distributions. It is not convenient to use high-indexed lattice planes and directions to describe the small deviations from the given models. The Euler subspace representation offers a readily comprehensible tool to get an idea about the characteristic of the experimentally detected OR.
Outstanding features favour the application of polymers and polymer composites in low-temperature technology. The booming hydrogen technology is a challenge for these materials, which are considered as seals and bearings in cryogenic pumps. In the present study, three types of thermoplastics, i.e., polyetheretherketone (PEEK), polyetherimide (PEI) and polyamide 6,6 (PA6,6), and one epoxy were considered as matrix materials. Micron-sized fillers, i.e., short carbon fibres, graphite flakes, and PTFE powders, were incorporated into these polymers together with nano-sized TiO2 particles. Optimised compositions of each matrix were selected from our previous works at room temperature in order to be studied at very low temperature conditions. In particular, frictional tests were carried out with polymer composite pins against polished steel surfaces under constant load over a certain distance in liquid hydrogen and liquid nitrogen. Afterwards, worn surfaces were analysed by using scanning electron microscopy (SEM). It was found out that the tribological properties in liquid hydrogen are dominated by the matrix materials, in particular thermoplastics perform generally slightly better than thermosetting resins.
Microstructural characterization of porous materials by two-dimensional X-ray refraction topography
(2004)
X-ray refraction topography determines the internal surfaces and interfaces of non-metallic porous materials within the range of namometer to micrometer dimensions. The method is based on refraction of X-rays caused by interfaces of microstructures in heterogeneous materials.
Generally, it permits a non-destructive full volume characterization of the pore topology. The X-ray refraction scanning technique make possible to visualize integral interface properties up to 10 μm spatial resolution by two-dimensional topographic images. It detects the spatially resolved internal surfaces of both, open and closed pores. Comparison to a certified powder reference of uniform grain size and known packing density reveals a quantitative measure for calibration requirements. An investigation on SiC- and Al2O3-ceramics illustrate the quantitative characterization of the internal surface density, pore sizes and their spatial distribution as well as local porosity fluctuations.
The employment of synchrotron radiation for refraction topography of materials has considerable advantages over standard x-ray sources. The much higher beam intensity and the parallel and monochromatic radiation provide faster measurements and better angular and spatial resolution. X-ray refraction techniques image the inner surface and interface concentration of micro-structured materials. This effect of x-ray optics is additional to small-angle scattering by diffraction, when the scattering objects reach micrometre dimensions. We have developed x-ray refraction techniques within the last decade in order to meet the growing demands for improved non-destructive characterization of high-performance composites, ceramics and other low-density materials. Sub-micron particle dimensions, the pore size of ceramics, the crack density distribution and single fibre debonding within damaged composites can be measured and visualized by computer-generated interface topographs. For this purpose investigations are now being performed at the new hard x-ray beamline of the Federal Institute for Materials Research and Testing (BAM) at BESSY, Berlin. This BAMline provides monochromatic radiation of photon energies from 5 to 60 keV from a double multilayer and/or a double-crystal monochromator. A separate instrument is dedicated to the further development and application of synchrotron radiation refraction (SRR) topography. Different from conventional small-angle scattering cameras with collimating slits and pinholes, scattering angles down to a few seconds of arc are selected by a single-crystal analyser, similar to a Bonse-Hart diffractometer. A 20 µm spatial resolution of the scattering micro-structures is achieved by a CCD camera with a fluorescent converter. First SRR topographs of aircraft composites [carbon fibre-reinforced plastics (CFRP), carbon fibre-reinforced ceramics (C/C), metal matrix ceramics (MMC)] will be reported.