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The hard X-ray beamline BAMline at BESSY II (Berlin, Germany) has now been in service for 20 years. Several improvements have been implemented in this time, and this review provides an overview of the imaging methods available at the BAMline. Besides classic full-field synchrotron X-ray computed tomography (SXCT), also absorption edge CT, synchrotron X-ray refraction radiography (SXRR), and synchrotron X-ray refraction tomography (SXRCT) are used for imaging. Moreover, virtually any of those techniques are currently coupled in situ or operando with ancillary equipment such as load rigs, furnaces, or potentiostats. Each of the available techniques is explained and both the current and the potential usage are described with corresponding examples. The potential use is manifold, the examples cover organic materials, composite materials, energy-related materials, biological samples, and materials related to additive manufacturing. The article includes published examples as well as some unpublished applications.
This sequence of X-Ray images shows how one of the most common Italian moka pots actually work! The sequence starts with a completely prepared moka pot (water in the bottom part, coffee in the middle and hot plate on). During the process the water starts to boil and the steam pressure pushes the hot water through the coffee into the bassin at the top of the pot.
This video sequence and additional explanations can also be found on Wikipedia.
Herein, we present a detailed investigation of the electrochemically triggered formation and dissolution processes of α- and β-sulfur crystals on a monolithic carbon cathode using operando high-resolution synchrotron radiography (438 nm/pixel).
The combination of visual monitoring with the electrical current response during cyclic voltammetry provides valuable insights into the sulfur formation and dissolution mechanism. Our observations show that the crystal growth process is mainly dictated by a rapid equilibrium between long-chain polysulfides on one side and solid sulfur/short-chain polysulfides on the other side, which is consistent with previous studies in this field. The high temporal and spatial resolution of synchrotron imaging enables the observation of different regimes during the sulfur formation and dissolution process. The appearance of short-chain polysulfides after the first anodic CV peak initiates a rapid dissolution process of α-sulfur crystals on the cathode. The increase in the long-chain lithium polysulfide concentration at the cathode surface during charge results in an increased crystal growth rate, which in turn produces imperfections in α- and β-sulfur crystals. There are strong indications that these defects are fluid inclusions, which may trap dissolved polysulfides and therefore reduce the electrochemical cell capacity.
The inspection of complex-shaped components, such as those enabled by additive manufacturing, is a major challenge in industrial quality assurance. A frequently adopted approach to volumetric non-destructive evaluation is X-ray computed tomography, but this has major drawbacks. Two-dimensional radiography can overcome some of these problems, but does not generally provide an inspection that is as capable.
Moreover, designing a detailed inspection for a complex-shaped component is a labour-intensive task, requiring significant expert input. In response, a computational framework for optimizing the data acquisition for an image-based inspection modality has been devised. The initial objective is to advance the capabilities of radiography, but the algorithm is, in principle, also applicable to alternative types of imaging. The algorithm exploits available prior
information about the inspection and simulations of the inspection modality to allow the Determination of the optimal inspection configuration, including specifically component poses with respect to the imaging system. As an intermediate output, spatial maps of inspection performance are computed, for understanding spatially varying limits of detection. Key areas of innovation concern the defect detectability evaluation for arbitrarily complex indications and the creation of an application-specific optimization algorithm. Initial trials of the algorithm are presented, with good results.