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X-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. 20 years ago the company Philips developed “COMSCAN”, a first application case in the aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. Their principle is to scan the object with a highly collimated X-ray needle beam from one side only and detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ testing in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projections from 360 degrees. An important advantage for the X-ray back scatter technique are also the materials used in additive manufacturing (polymers, ceramics, light metals like Aluminum or Titanium). These materials with lower density and lower Z values give better scatter signals than metals with higher densities and Z values. The back scatter intensity decreases with increasing density and Z value of the material. But the requirements on spatial resolution and contrast sensitivity are more stringent for non-destructive testing of additive manufactured parts compared to the security area. In NDT sizes of indications smaller than 1 mm have to be detected clearly. The investigation of these limits on a stateof-the-art prototype for X-ray back scattering using rotating collimated X-ray needle beams is a part of the BAM project “ProMoAM”. The contribution shows first results of the optimization for NDT and the achieved application limits for several example cases.
The Probability of Detection (POD) is used to evaluate the detectability of non-destructive testing (NDT) systems. The POD is highly dependent on the amount of available data. The Bayesian approach provides a solution to compute POD-curves in case of a small amount of real defects without losing the necessary information. The result contains the needed information for the computation of POD-curves for real defects with an acceptable amount of information, even for sparse amount of data. In this paper is shown limitations of the Bayesian approach and how it can be applied to NDT. The Bayesian approach is applied in this case to the evaluation of radiographic testing. Bayesian approach is applied to determine POD-curves for the inspection techniques of nuclear fuel disposal canisters. The reason for using Bayesian approach is the high safety demands and also the low amount of real defects due to the high quality of the reliable production techniques.
Computer simulation of radiography can be used for different purposes in NDT, such as qualification of NDT systems, optimization of radiographic parameters, feasibility analysis, model-based data interpretation, and training of NDT/NDE personnel. BAM has been working on modeling in the field of radiographic testing for many years. With the gathered theoretical background and the familiarity with practical requirements of industrial application the simulation software aRTist has been developed. This analytical simulator includes a description of the radiation source, the interaction of radiation with test pieces and flaws, and the detection process with special focus on film and digital industrial radiology. It features high processing speed with nearinteractive frame rates and a high level of realism. Here we focus on the recent developments of the simulator, notably the release of aRTist version 2. Extended functionality regarding automated virtual computed tomography now allows for arbitrary scan paths. Another program extension supports reliability investigations and provides a user interface for planning automatic simulations with varying parameters and defects.