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- 2008 (1) (entfernen)
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- Polysulfone (1) (entfernen)
Ultra-thin films of polysulfone are prepared by spin coating down to thicknesses below 10 nm on an aluminum support and investigated by broadband dielectric spectroscopy. As a main result is was found that the glass transition temperature Tg does not depend on the film thickness for thicknesses larger than 10 nm. Secondly from the analysis of the dielectric strength it is concluded that the polysulfone segments form an adsorbed layer with a reduced mobility at the Al support having a thickness of ca. 5 nm.