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Dislocations, as carriers of plastic deformation, affect important properties in technical materials, e. g., plasticity. The realistic description of plastic deformation caused by dislocations demands the representative measurement of their features, e.g., line direction, slip plane, Burgers vector and density. Bulk deformation of structural and functional alloys requires reliable data from large regions. The filiform nature of dislocations interacting with complex microstructures additionally demands observation and analysis techniques that allow resolving the details of their interactions in space. The use of electron tomography for this purpose is bound to difficult and time consuming experimental setups, which are not always applicable to any material. In this contribution a new tool is presented, which enables the three-dimensional reconstruction, visualization and quantification of dislocation densities and directions from manual tracing of scanning transmission electron microscopy (STEM) stereo-pairs. Examples are shown from samples of a creep-deformed monocrystalline Ni-base superalloy.
Direct current (DC) fast flow glow discharge mass spectrometry is an important and versatile tool for multielemental trace analysis of conductive solid materials down to the µg/kg level. Special benefits are minimum demands on sample preparation, avoiding losses and contamination, and only short analysis time.
For fast flow GD sources, the quantification strategy based on relative standard sensitivity factors (Standard RSFs) which are independent of matrix is not sufficiently satisfying regarding accuracy for each matrix and element [1]. Therefore matrix-matched calibration samples (MMCS) are required to achieve reliable quantification. In fact, the list of existing certified reference materials (CRM) appropri-ate for calibration in trace analysis is rather short.
Convenient synthesis of homogeneous MMCS, as e.g. easily obtained in liquid sampling spectrometry, can facilitate the application of fast flow GD-MS for quantification of impurities in a variety of matrices.
Pressing of metal powders for the preparation of MMCS for GD-MS was suggested earlier [2], the method was further modified by use of analyte solutions for doping of rather pure metal powders such as Cu and Zn [3], but has not yet been applied Ni matrix.
In the present work we describe the determination of matrix-dependent relative sensitivity factors (RSFs) for Mg, Al, Cr, Mn, Fe, Co, Cu, Zn, Ag, Cd, Tl, Pb and Bi in pure Ni by using the liquid doping approach for the preparation of synthetic pressed Ni-powder samples. A four point-calibration was used applying the fast flow glow discharge mass spectrometer, Element GD (Thermo Fisher). The determined RSF were verified against suitable CRM and compared with the standard RSF given by the supplier of the instrument.
The obtained results demonstrate a satisfying Agreement with the certified values of the CRM and a significant improvement for the quantification of most of the determined elements in comparison with standard RSF.