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This paper is a case study of complete substitution of sodium-metasilicate in zeolite Na-A synthesis by an electrostatic filterash (FA) arising in high amounts during silane waste incineration process.The silicate abundant FA is a suitable material for reinsertion in zeolite chemistry. This is shown in the presented investigation by the development of a model reaction process at low temperatures (50–60 °C) and short times (1.5–4 h). The experiments were performed under addition of NaAlO2 and variation of the alkalinity and the reaction period. Characterization and fine tuning of the process was mainly done by studying the kinetics of FA digestion and zeolite crystallization by XRD and chemical analyses (ICP-OES) of solutions and solids. It could be shown that pure FA was mostly dissolved (98%) in 8 m NaOH already after 1 h. Addition of NaAlO2 and crystallization for further 60 min under optimized conditions at 50 °C yielded to a suitable product. It consists of zeolite Na-A (92% by mass) beside some hydrosodalite (8% by mass). According to this low temperature short time process this study is a contribution for the development of energy efficient recycling solutions.
Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon
(2016)
The analysis of chemical and elemental in-depth variations in ultra-thin organic layers with thicknesses below 5 nm is very challenging. Energy- and angle-resolved XPS (ER/AR-XPS) opens up the possibility for non-destructive chemical ultra-shallow depth profiling of the outermost surface layer of ultra-thin organic films due to its exceptional surface sensitivity. For common organic materials a reliable chemical in-depth analysis with a lower limit of the XPS information depth z95 of about 1 nm can be performed. As a proof-of-principle example with relevance for industrial applications the ER/AR-XPS analysis of different organic monolayers made of amino- or benzamidosilane molecules on silicon oxide surfaces is presented. It is demonstrated how to use the Si 2p core-level region to non-destructively depth-profile the organic (silane monolayer) inorganic (SiO2/Si) interface and how to quantify Si species, ranging from elemental silicon over native silicon oxide to the silane itself. The main advantage of the applied ER/AR-XPS method is the improved specification of organic from inorganic silicon components in Si 2p core-level spectra with exceptional low uncertainties compared to conventional laboratory XPS.