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- Raman microscopy (3) (entfernen)
This overview article provides insight into how to apply Raman spectroscopy in combination with a confocal, optical microscope setup on polycrystalline material systems, in order to obtain quantitative information on phase distribution, grain sizes, crystal orientations and microstrain. Although the present work uses Cu(In,Ga)(S,Se)₂ absorber layers in corresponding thin-film solar cells as a model system to demonstrate the capabilities of Raman microspectroscopy, the approaches discussed may be applied to any organic or inorganic, polycrystalline materials system.
Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10^-4. These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy.
Raman microspectroscopic imaging was just recently introduced into the analysis of cement stone. Here, we demonstrate this approach on 19th-century Roman and Portland cement mortars and extend it to gypsum-based samples originating from a medieval stucco sculpture (high-burnt gypsum) and a stucco ornament prefabricated at the beginning of the 20th century (plaster of Paris). Furthermore, the distributions of dolomite and Calcite were mapped in an accessory mineral grain with approx. 500 nm lateral Resolution demonstrating the ability for studying alteration processes such as dedolomitisation. As we would like to make this approach accessible to other researchers, we discuss its present status, advantages, limitations and pitfalls.