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- Ultra thin polymer films (2) (entfernen)
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In thin polymer films, little is known about the dynamics of the adsorbed layers, despite their importance in innovative applications. Here, Broadband Dielectric Spectroscopy (BDS) was utilized to investigate the glassy dynamics of thin films of a low MW Poly (vinyl methyl ether) (PVME) (thicknesses: 7 – 160 nm). A recently developed nano-structured capacitor arrangement was employed; where a silicon wafer with nanostructured SiO2 nano-spacers, with heights of 35 nm and 70 nm, is placed on top of a thin film spin coated on an ultra-flat highly conductive silicon wafer. Further, PVME/SiO2 interactions was confirmed by contact angle measurements, hence an adsorbed layer is allowed to form. For films with thicknesses smaller than 50 nm, BDS measurements showed two relaxation processes. The first process coincided, in its position and temperature dependence, with the -relaxation of bulk PVME, thus it was assigned to the -relaxation of a bulk-like layer. The second process showed a different temperature dependence and was ascribed to the relaxation of polymer segments adsorbed at the substrate. Both processes showed no thickness dependence. The results will be discussed in detail. To our knowledge, this is the first study of the segmental dynamics of an adsorbed layer in thin films.
In the course of miniaturizing modern technology down to the molecular scale, understanding the materials behavior has to be investigated and deviations from the bulk have to be understood. A combination of nano-sized relaxation spectroscopies (Broadband Dielectric Spectroscopy (BDS) and Specific Heat Spectroscopy (SHS)) employing AC nanochip calorimetry were utilized to investigate the glassy dynamics of ultra-thin films of blends of Poly (vinyl methyl ether) (PVME) / Polystyrene (PS) (50:50 and 25/75 wt-%), which are miscible in the bulk (thicknesses: 8nm - 200nm, film thickness was controlled by ellipsometry, film topography by AFM). Both methods are sensitive to different probes; where SHS senses entropy fluctuations BDS measures dipole fluctuations. For BDS measurements, a recently developed nano-structured electrode sample arrangement is employed. By measuring the dynamic glass transition in dependence of the film thickness, SHS showed that the Tg of the whole film was strongly influenced by a nanometer-thick surface layer at the polymer/air interface due to a self-assembling process. Compared to the SHS results the BDS measurements show a completely different behavior. At high temperatures the temperature dependence of the relaxation times of the films follows that of bulk-like PS/PVME obeying the VFT-law. With decreasing temperature the temperature dependence deviates from the VFT to an Arrhenius law where the apparent activation energy decreases with decreasing film thickness. This is the first example were confinement induced changes were observed by BDS for ultra-thin films. All results were analyzed in detail in a comprehensive discussion.