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Electromagnetic waves with frequencies between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials makes T-rays attractive to reveal discontinuities in polymer and ceramic materials. THz-Time Domain Spectroscopy Systems (THz-TDS) are available on the market today which operates with THz-pulses transmitted and received by optically pumped semiconductor antennas. In THz-TDS the travelling time (ToF) and shape of the pulse is changed if it interacts with the dielectric material and its inherent disconti-nuities. A tomogram of the object under the test can be reconstructed from time of flight diffraction (ToFD) scans if a synthetic focusing aperture (SAFT) algorithm is applied. Otherwise, planar discontinuities like cracks in plastics or delaminated lay-ers in composites can be abstracted as layers located at any angle in relation to the outer sample surface direction. A tomogram from the scanned sample can then be reconstructed in case the interactions of electromagnetic pulses with the existing in-herent interfaces are detectable and a model is assumed which describes the device under the test as multilayer structure composed of thin layers with different dielec-tric properties.
A short description of both the SAFT – and Optical Layer algorithm for the recon-struction of the inherent structure is initially given. Measurements on representative samples with a variety of artificially produced small and large scale. Reconstructed tomograms are presented to discuss and evaluate the benefits and limits of the two different reconstruction approaches.
In ultrasonic testing, the time of flight (ToF) of a signal can be used to infer material and structural properties of a test item. In dispersive media, extracting the bulk wave velocity from a received signal is challenging as the waveform changes along its path of propagation. When using signal features such as the first peak or the envelope maximum, the calculated velocity changes with the propagation distance. This does not occur when picking the signal onset. Borrowing from seismology, researchers used the Akaike information criterion (AIC) picker to automatically obtain onset times. In addition to being dependent on arbitrarily set parameters, the AIC picker assumes no prior knowledge of the spectral properties of the signal. This is unnecessary in ultrasonic through-transmission testing, where the signal spectrum is known to differ significantly from noise. In this contribution, a novel parameter-free onset picker is proposed, that is based on a spectral entropy criterion (SEC) to model the signal using the AIC framework. Synthetic and experimental data are used to compare the performance of SEC and AIC pickers, showing an improved accuracy for densely sampled data.