Filtern
Dokumenttyp
- Vortrag (2) (entfernen)
Sprache
- Englisch (2)
Referierte Publikation
- nein (2) (entfernen)
Schlagworte
- Core-shell particles (2) (entfernen)
Organisationseinheit der BAM
Eingeladener Vortrag
- nein (2)
A particle roughness analysis tool, based on electron microscopy (EM) images. The influence of various parameters on the calculated roughness was also investigated: the setting of the proper threshold, accelerating voltage, etc. The samples were gradually tilted to extend imaging information of more than only one projection. Furthermore, the measurement uncertainty of the profile roughness of particles associated to various orientations was estimated.
This study presents a practical procedure to give access to more information by tilting the sample holder and hence allowing images of a single particle to be recorded at different orientations under the same view angle. From the analysis of these images, extended information on surface roughness of the particle can be extracted. Thus, instead of obtaining 2D information from a single SEM image, three-dimensional (3D) information is obtained from 2D projections recorded at different particle orientations.