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The motivation to examine the influence of friction on surfaces of energetic materials (EM) has diverse backgrounds. On the one hand the very old hot spot theory predicts, that the size of such hot spot could be in the range of a molecule. The initiation of an EM could start by mechanical excitation, i.e. friction, and continues driven by an exothermal chemical reaction. Following such phenomena on the molecular scale with an imaging method such as AFM should enable us to separate several steps of ignition, if there are any. The experiments showed that HMX mainly undergoes a plastic deformation without further consequences. TNP however showed self healing in the wear track after scratching and simultaneously the destruction of a crystal edge outside the wear track. Additionally nanoparticles appear, tribologists call this "third body formation", which are proven to have a different chemical composition as the original TNP. The self healing effect on the surface is verified with experiments on self diffusion of TNP molecules to and fro the free edges of the crystal. The conclusion is that the formation of a hot spot can be shown to consist of several subsequent steps, separated temporally and locally. The goal to excite the thermal decomposition of a whole TNP crystal (nanoexplosion) was yet not reached due to unfavourable conditions related to thermal conductivity and build-up of pressure.
Atomic force microscopy based Infrared spectroscopy (AFM-IR) is a quickly evolving technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. This is possible since the detection method is based on a very sharp AFM tip which starts to oscillate when the sample starts to thermally expand (the changed is caused by the absorption of IR wavelength) where the thermal expansion is related to the IR absorption. This presentation briefly described the application of that new technique from polymer characterization and utilization of AFM-IR in material research, up to life science applications.
Structural changes in plasmid DNA caused by radiation and its protection by Ectoine: an AFM analysis
(2017)
Most ionizing radiation in water ends in an avalanche of low energy electrons which play a dominant role together with OH-radicals in damaging DNA. In the present study we irradiated plasmid DNA with electrons (primary energy 30keV) under physiological conditions, performed with as well as without Ectoine. Ectoine is a compatible solute, synthesized and accumulated in molar concentration within bacteria to withstand osmotic stress or different other stressors.
Plasmid DNA (pUC19, 2686 bp) was studied due to its supercoiled isoform which is highly sensitive to radiation damage. In biochemistry gel electrophoresis is applied for structural analysis of DNA. Although it is a standard technique, a reliable discrimination of short fragments caused by radiation is often difficult. AFM is also commonly used for imaging susceptible biomolecules and, since it is based on a single molecule observation, for analysis of contour lengths of linear DNA as well. Therefore, in our study the structural changes in plasmid DNA after irradiation with different doses were quantitatively analyzed by means of intermittent contact AFM. The figure shows representative AFM images of electron irradiated pUC19 DNA (bar=200nm). For AFM imaging the DNA was chemically fixed on ultra-smooth mica. As can be clearly seen, with increasing radiation dose the number of undamaged DNA declines and fragmented DNA arises (A, B). In aqueous Ectoine solution (1M) the effect of radiation on DNA is dramatically depressed. Ectoine apparently confers protection even against high radiation: the plasmids remain predominantly in the supercoiled isoform (D). Therefore, we strongly believe that Ectoine is a potent protective substance of DNA against ionizing radiation.
Formation of interphases between inorganic nanofillers and thermoplastic matrices are usually correlated to short-range interactions which does not exceed more than tens of nanometers away from the surface of the filler. Nevertheless, in nanocomposites with thermosetting matrices, the effect of nanofillers on the properties of the matrix is not limited to the immediate vicinities, but a long-range property alteration of the bulk polymer may be observed. The interaction between nanofillers and the polymer can disturb the curing reaction and alters the chemical, physical and mechanical properties of the polymer network in the matrix phase. In our studies, we aim to investigate short and long-range interphases of a nanocomposite system consisting of a thermosetting matrix (DGEBA) filled with an inorganic nanoparticle (boehmite). For this purpose, a combination of atomic force microscopy (AFM)-based approaches is implemented. Scanning kelvin probe microscopy (SKPM) was used to map the compositional contrast and the interphase with different electrical properties than the bulk. The mechanical properties of the interphase were probed by high resolution intermodulation AFM. (ImAFM). Furthermore, infrared spectroscopy AFM (AFM-IR) is used to investigate the chemical structure of the matrix at different distances from the nanoparticle. SKPM and (AFM-IR) measurements both show a long-range (to 10 µm) effect of boehmite on the chemical structure and surface potential of the bulk epoxy, respectively, whereas ImAFM force measurements reveals a short-range mechanical interphase between the filler and the matrix. The AFM-IR demonstrated the existence of unreacted anhydride hardener at the interphase. This indicates the preferential absorption of anhydride on the surface of boehmite. The consequence of such a selective interaction between the inorganic filler and the epoxy components is disturbance of the epoxy-hardener stoichiometric ratio, the curing mechanism. and the alteration of bulk properties of the matrix.
This presentation is structured in two parts: i) Hybrid metrology by combining SEM with AFM (N. Feltin) and ii) hybridization and corelative microscopy by SEM, STEM-in-SEM, TEM, EDS, Auger Electron Microscopy, TKD and more (D. Hodoroaba).
The first part is focused on the metrological part of the hybrid measurement SEM-AFM, the second part offers some further possibilities of correlative microscopy of nanoparticles based on practical examples.
It sounds like being a simple analytical task, it is definitely not. The way toward accurate measurement of the size distribution of nanoparticles (NPs) with complex shape, having a broad size polydispersity, with inhomogeneous chemistry, and with a high degree of agglomeration/aggregation is very challenging for all available analytical methods. Particularly for the NPs with complex shape, the access to the smallest dimension (as e.g. required for regulatory purposes) can be enabled only by using imaging techniques with spatial resolution at the nanoscale. Moreover, the full 3D-chacterisation of the NP shape can be provided either by advanced characterization techniques like 3D-TEM tomography or by correlative analysis, i. e. synergetic/complementary measurement of the same field-of-view of the sample with different probes. Examples of the latter type of analysis are: i) electron microscopy for the lateral dimensions and AFM for the height of the NPs, ii) SEM with STEM-in-SEM (also called T-SEM), iii) Electron Microscopy with TKD (Transmission Kikuchi Diffraction) for determination of the geometrical orientation of crystalline NPs, iv) Raman and SEM for e.g. thickness of graphen flakes, or v) Electron Microscopy for descriptive NP shape and SAXS for the NP concentration, the latter as a NP property able to be measured with higher and higher accuracy. For all these types of measurement, reference NPs are necessary for the validation of the measured size. Particularly non-spherical reference NPs are still missing. Examples of such new reference NPs as characterized by the correlative analyses enumerated above will be presented in detail in the contribution.
The main outcomes of the EMPIR project nPSize are presented and the suitability of the new capabilities, e.g. reference materials, sample preparation protocols, measurement procedures, and data analysis, to be standardized and implemented in accredited analytical laboratories is discussed. Complementation and/or filling gaps of published and ongoing standardisation projects on size, shape and number concentration measurements under ISO/TC 229/JWG 2 are offered.
The two VAMAS inter-laboratory comparisons resulted from the nSPize project and just started under TWA 34 Nanoparticle Populations (Projects #15 and #16) of bipyramidal TiO2 anatase and bimodal SiO2 nanoparticles are presented in detail.
The progress in the VAMAS Project #15" Measurement of particle size and shape distribution of bipyramidal titania including deposition from liquid suspension" within TWA 34 Nanoparticle Populations is presented with highlight of the following points:
- Determine and compare particle size and shape distribution by means of:
• electron microscopy (SEM, TEM, STEM-in-SEM)
• atomic force microscopy (AFM)
• small angle X-ray scattering (SAXS)
- Determine uncertainty induced by deposition protocol from liquid suspension with comparison to known values from a prior ILC with already deposited nanoparticles on TEM grids.
- Provide comparative validation of protocols for the techniques other than TEM.
The progress of the VAMAS Project 16 "Measurement of (relative) number concentration of bimodal silica nanoparticles including deposition from liquid suspension" in TWA 34 Nanoparticle Populations is presented. Follwowing points are discusssed:
- Validate the performance of imaging methods to measure the relative number concentration
• electron microscopy (SEM, TEM) and atomic force microscopy (AFM)
• two modes of bimodal (30 and 60 nm) silica nanoparticles
- Validate the performance of small angle X-ray scattering (SAXS) for the traceable measurement of the number concentration of the two modes.
This contributions shows the first results of the ongoing interlaboratory comparisons under VAMAS/TWA 34 Nanoparticle populations related on the determination of pasrticle size distribution and relative concentration of nanoparticles and an example of an ILC running under VAMAS/TWA 41 Graphene and Related 2D Materials on the determination of the lateral diemsnions of graphene oxide flakes by Scanning Electron Microscopy. The link to related standardisation projects at ISO/TC Nanotechnologies are explained.