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- 2023 (9) (entfernen)
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The presentation demonstrates an application of multi-scale optical imaging methods such as spectroscopic imaging ellipsometry and white light interference microscopy for the investigation of wide-bandgap semiconductors for power electronics. The capabilities of these methods for the development of new reference calibration samples for scanning microwave microscopes (SMM) and conductive atomic force microscopes (C AFM) are discussed.
The European Commission has identified Advanced Manufacturing and Advanced Materials as two of six Key Enabling Technologies (KETs). It is considered that Metrology is a key enabler for the advancement of these KETs. Consequently, EURAMET, the association of metrology institutes in Europe, has strengthened the role of Metrology for these KETs by enabling the creation of a European Metrology Network (EMN) for Advanced Manufacturing. The EMN is comprised of National Metrology Institutes (NMIs) and Designated Institutes (DIs) from across Europe and was formally established in October 2021. The aim of the EMN is to provide a high-level coordination of European metrology activities for the Advanced Manufacturing community.
The EMN itself is organized in three sections representing the major stages of the manufacturing chain: 1) Advanced Materials, 2) Smart Manufacturing Systems, and 3) Manufactured Components & Products. The EMN for Advanced Manufacturing is engaging with stakeholders in the field of Advanced Manufacturing (large companies & SMEs, industry organisations, existing networks, and academia), as well as the wider Metrology community, including Technical Committees, to provide input for the Strategic Research Agenda (SRA) on Metrology for Advanced Manufacturing.
This contribution will give an overview about the first version of the SRA prepared by the EMN for Advanced Manufacturing.
Measurements are an important fundament of natural science in general and of chemical analysis in particular. Metrology is the science (and art) of performing measurements. The basic concepts and terms of metrology and their practical implementation are introduced. The very special peculiarities of chemical measurements that are absent in physical measurements are discussed.
This presentation provides a short introduction to the Commission on Isotopic Abundances and Atomic Weights (CIAAW). It describes the role of the Commission and provides an insight into its work and the corresponding principal tasks. Finally, it provides the reader with the latest achievements and with the most recent publications.
The reference method for obtaining absolute isotope ratios still is the isotope mixture approach. Due the huge efforts required the full isotope mixture approach is applied only by a few institutes worldwide. To enable an IRWG key comparison with a sufficiently large number of participants a proposal for absolute cu isotope ratios is presented where participants will be provided with the enriched isotopes, the isotope mixtures and the samples. In parallel a pilot study will be organized where alternative approaches for obtaining absolute Cu isotope ratios can be applied.
IRWG strategy update
(2023)