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This paper presents a new X-ray backscatter technique (XBT) for non-destructive imaging of aerospace materials with only a single-sided access. It uses a special twisted slit collimator to inspect the whole object by changing the viewing direction of the X-ray backscatter camera. For the first time, the X-ray backscatter measurements were conducted using high-energy (>500 keV) X-ray sources. Experiments were performed on thick complex structured aluminium components, stringers and honeycomb structures to validate the applicability of the present technique to image small changes in the material properties and also to detect low-density material inclusions. In order to reduce the inspection time from hours to several seconds and to improve the image quality of the X-ray backscatter image, the backscattered signals were measured using a digital detector array with high spatial resolution (200 µm). The influence of the energy of the X-ray source and the slit width of the camera on the X-ray backscatter image were also investigated. In the proposed technique, the whole object is irradiated by an un-collimated X-ray beam resulting in a low image acquisition time of 3 min that facilitates the use of XBT for the real time NDT&E of aerospace materials.
In various kinds of radiography, deficient transmission imaging may occur due to backlighting inside the detector itself arising from light or radiation scattering. The related intensity mismatches barely disturb the high resolution contrast, but its long range nature results in reduced attenuation levels which are often disregarded. Based on X-ray observations and an empirical formalism, a procedure is developed for a first order correction of detector backlighting. A backlighting factor is modeled as a function of the relative detector coverage by the sample projection. Different cases of sample transmission are regarded at different backlight factors and detector coverage. The additional intensity of backlighting may strongly affect the values of materials’ attenuation up to a few 10%. The presented scenario provides a comfortable procedure for corrections of X-ray or neutron transmission imaging data.
The progress in X-ray detector electronics (sensitivity and speed) allows meanwhile fast single photon detection by a matrix detector. Combined photon counting and energy discrimination is implemented in the electronic circuit of each detector pixel. The company XCounter developed detectors based on CdTe single crystals, which can be tiled to larger areas and have a pixel size of 100ìm. The largest area available in beginning of 2014 is 50x75 mm². These detectors have very promising properties, which make them very suitable for NDT applications:
1. A CdTe attenuation layer of 750 µm thickness allows efficient X-ray detection up to ca. 300 keV. In counting mode only photon noise is important; no other detector noise sources need to be considered. There is no Offset signal without radiation.
2. Each of the detector pixels has two energy thresholds. These can be used for dual energy imaging for materials separation. Also the suppression of scattered radiation by energy thresholding will improve the image contrast sensitivity. First experiments will be presented which demonstrate the advantages of this new detector technology over the conventional charge integrating detectors.
A challenge is the development of a modified detector calibration procedure, which becomes critical at longer exposure times.