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Low-energy electrons (LEEs) play an important role in DNA radiation damage. Here we present a method to quantify LEE induced strand breakage in well-defined oligonucleotide single strands in terms of absolute cross sections. An LEE irradiation setup covering electron energies <500 eV is constructed and optimized to irradiate DNA origami triangles carrying well-defined oligonucleotide target strands. Measurements are presented for 10.0 and 5.5 eV for different oligonucleotide targets. The determination of absolute strand break cross sections is performed by atomic force microscopy analysis. An accurate fluence determination ensures small margins of error of the determined absolute single strand break cross sections σSSB. In this way, the influence of sequence modification with the radiosensitive 5-Fluorouracil (5FU) is studied using an absolute and relative data analysis. We demonstrate an increase in the strand break yields of 5FU containing oligonucleotides by a factor of 1.5 to 1.6 compared with non-modified oligonucleotide sequences when irradiated with 10 eV electrons.
Atomic force microscopy based Infrared spectroscopy (AFM-IR) is a quickly evolving technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. This is possible since the detection method is based on a very sharp AFM tip which starts to oscillate when the sample starts to thermally expand (the changed is caused by the absorption of IR wavelength) where the thermal expansion is related to the IR absorption. This presentation briefly described the application of that new technique from polymer characterization and utilization of AFM-IR in material research, up to life science applications.
The adhesion of poly(methyl methacrylate) (PMMA) and polystyrene (PS) films, whose surface has been previously structured by dynamic plowing lithography (DPL), has been measured by means of forcedisplacement curves. The different adhesion of modified and unmodified PS leads to the assumption that polymer chains are broken during DPL. After measuring the energy dissipated by the tip during DPL, in order to check that the transferred energy is sufficient to break covalent bonds, the polymer chain scission caused by the lithographic process has been definitely confirmed by size exclusion chromatography measurements of the lithographed films.
A European EMPIR project, which aims to use large-scale piezoresistive microprobes for contact resonance applications, a well-established measurement mode of atomic force microscopes (AFMs), is being funded. As the probes used in this project are much larger in size than typical AFM probes some of the simplifications and assumptions made for AFM probes are not applicable. This study presents a guide on how to systematically create a model that replicates the dynamic behavior of microprobes, including air damping, nonlinear sensitivities, and frequency dependencies. The model is then verified by analyzing a series of measurements.
Formation of interphases between inorganic nanofillers and thermoplastic matrices are usually correlated to short-range interactions which does not exceed more than tens of nanometers away from the surface of the filler. Nevertheless, in nanocomposites with thermosetting matrices, the effect of nanofillers on the properties of the matrix is not limited to the immediate vicinities, but a long-range property alteration of the bulk polymer may be observed. The interaction between nanofillers and the polymer can disturb the curing reaction and alters the chemical, physical and mechanical properties of the polymer network in the matrix phase. In our studies, we aim to investigate short and long-range interphases of a nanocomposite system consisting of a thermosetting matrix (DGEBA) filled with an inorganic nanoparticle (boehmite). For this purpose, a combination of atomic force microscopy (AFM)-based approaches is implemented. Scanning kelvin probe microscopy (SKPM) was used to map the compositional contrast and the interphase with different electrical properties than the bulk. The mechanical properties of the interphase were probed by high resolution intermodulation AFM. (ImAFM). Furthermore, infrared spectroscopy AFM (AFM-IR) is used to investigate the chemical structure of the matrix at different distances from the nanoparticle. SKPM and (AFM-IR) measurements both show a long-range (to 10 µm) effect of boehmite on the chemical structure and surface potential of the bulk epoxy, respectively, whereas ImAFM force measurements reveals a short-range mechanical interphase between the filler and the matrix. The AFM-IR demonstrated the existence of unreacted anhydride hardener at the interphase. This indicates the preferential absorption of anhydride on the surface of boehmite. The consequence of such a selective interaction between the inorganic filler and the epoxy components is disturbance of the epoxy-hardener stoichiometric ratio, the curing mechanism. and the alteration of bulk properties of the matrix.
The accurate determination of wear volumes is a prerequisite for the study of numerous tribological phenomena. Wear volumes can be measured with different techniques or else be calculated starting from some quantities measured from the wear scar. Advantages and drawbacks of the measuring techniques are shown by means of wear scars and calottes resulting from ball-on-plane tests with 100Cr6 specimens. When measuring wear volumes, white light interferometry results to be one of the most suitable techniques. When wear volumes are calculated, errors result mainly from two sources: (1) the arbitrary choice of one or few line profiles for the determination of the width and of the planimetric wear, and (2) approximations in the calculation, which are even necessary when values of the wear volumes of the single tribological partners and not only the total volume are of interest. The effect of both error sources on the accuracy in the determination of wear volumes is characterized and elucidated by examples. It is found that errors due to approximations are negligible when compared to errors due to the arbitrary choice of one line profile.
Force-deformation curves have been acquired using nanoindentation and atomic force microscopy on two amorphous polymer samples. The shape and size of the indenter tip was characterized using a white light interferometer and AFM. The measured nanoindentation curves were fitted with the Hertz equation to calculate the Young's modulus of the polymers. Once the Young's moduli of the polymers were known, AFM was used to acquire force-distance-curves on the same samples. We also used the Hertz theory for the analysis in this case. As a result, the tip radius of the AFM cantilever tip could be measured.
This procedure is proposed as a method to determine the shape and size of AFM tips for the quantitative characterization of surface forces through force-distance curves.
A controlled, reproducible, gram-scale method is reported for the covalent functionalization of graphene Sheets by a one-pot nitrene [2+1] cycloaddition reaction under mild conditions. The reaction between commercially available 2,4,6-trichloro-1,3,5-triazine and sodium azide with thermally reduced graphene oxide (TRGO) results in defined dichlorotriazine-functionalized sheets. The different reactivities of the chlorine substituents on the functionalized graphene allow stepwise post-modification by manipulating the temperature.
This new method provides unique access to defined bifunctional 2D nanomaterials, as exemplified by chiral surfaces and multifunctional hybrid architectures.
We have studied the anisotropic milling of Cu with respect to the milling rate and the milling topography, as well. The background is twofold: i) anisotropic milling has to be taken into account during the preparation of TEM specimens and in the manufacturing of micro parts from crystalline materials, and ii) the orientation depending milling behaviour can be used to generate topographies with specific properties with respect to, for example, adsorption, wear, and corrosion.
In this paper, the accurate determination of the size and size distribution of bipyramidal anatase nanoparticles (NPs) after deposition as single particles on a silicon substrate by correlative Scanning Electron Microscopy (SEM) with Atomic Force Microscopy (AFM) analysis is described as a new measurement procedure for metrological purposes. The knowledge of the exact orientation of the NPs is a crucial step in extracting the real 3D dimensions of the particles. Two approaches are proposed to determine the geometrical orientation of individual nano‐bipyramides: (i) AFM profiling along the long bipyramid axis and (ii) stage tilting followed by SEM imaging. Furthermore, a recently developed method, Transmission Kikuchi Diffraction (TKD), which needs preparation of the crystalline NPs on electron‐transparent substrates such as TEM grids, has been tested with respect to its capability of identifying the geometrical orientation of the individual NPs. With the NPs prepared homogeneously on a TEM grid, the transmission mode in a SEM, i.e., STEM‐in‐SEM (or T‐SEM), can be also applied to extract accurate projection dimensions of the nanoparticles from the same sample area as that analysed by SEM, TKD and possibly AFM. Finally, Small Angle X‐ray Scattering (SAXS) can be used as an ensemble technique able to measure the NPs in liquid suspension and, with ab‐initio knowledge of the NP shape from the descriptive imaging techniques, to provide traceable NP size distribution and particle concentration.
It sounds like being a simple analytical task, it is definitely not. The way toward accurate measurement of the size distribution of nanoparticles (NPs) with complex shape, having a broad size polydispersity, with inhomogeneous chemistry, and with a high degree of agglomeration/aggregation is very challenging for all available analytical methods. Particularly for the NPs with complex shape, the access to the smallest dimension (as e.g. required for regulatory purposes) can be enabled only by using imaging techniques with spatial resolution at the nanoscale. Moreover, the full 3D-chacterisation of the NP shape can be provided either by advanced characterization techniques like 3D-TEM tomography or by correlative analysis, i. e. synergetic/complementary measurement of the same field-of-view of the sample with different probes. Examples of the latter type of analysis are: i) electron microscopy for the lateral dimensions and AFM for the height of the NPs, ii) SEM with STEM-in-SEM (also called T-SEM), iii) Electron Microscopy with TKD (Transmission Kikuchi Diffraction) for determination of the geometrical orientation of crystalline NPs, iv) Raman and SEM for e.g. thickness of graphen flakes, or v) Electron Microscopy for descriptive NP shape and SAXS for the NP concentration, the latter as a NP property able to be measured with higher and higher accuracy. For all these types of measurement, reference NPs are necessary for the validation of the measured size. Particularly non-spherical reference NPs are still missing. Examples of such new reference NPs as characterized by the correlative analyses enumerated above will be presented in detail in the contribution.
Corrosion behaviour of AlCrFe2Ni2Mox (x = 0.0, 0.1, 0.15, 0.3 and 0.6) high-entropy alloys was investigated in a 0.1 M H2SO4 solution. Passive films formed upon anodic polarisation, built of Al-based inner layer and (Cr, Fe, Mo)-based outer layer, had good protective properties. In particular, they prevented corrosion of the (Al, Ni)-rich BCC-B2 phase, which was observed under open-circuit conditions. Moderate amounts of Mo, up to x = 0.3, positively affected the passivation ability of AlCrFe2Ni2. Significant changes in microstructure and phase composition of the alloy at higher Mo concentrations (x = 0.6) resulted in deterioration of its corrosion resistance.
Interfaces provide the structural basis for function as, for example, encountered in nature in the membrane-embedded photosystem or in technology in solar cells. Synthetic functional multilayers of molecules cooperating in a coupled manner can be fabricated on surfaces through layer-by-layer self-assembly. Ordered arrays of stimuli-responsive rotaxanes undergoing well-controlled axle shuttling are excellent candidates for coupled mechanical motion. Such stimuli-responsive surfaces may help integrating synthetic molecular machines in larger systems exhibiting even macroscopic effects or generating mechanical work from chemical energy through cooperative action. The present work demonstrates the successful deposition of ordered mono- and multilayers of chemically switchable rotaxanes on gold surfaces. For the first time, rotaxane mono- and multilayers are shown to reversibly switch in a coupled manner between two ordered states as revealed by linear dichroism effects in angle-resolved NEXAFS spectra. Such a concerted switching process is observed only when the surfaces are well packed, while less densely packed surfaces lacking lateral order do not exhibit such effects.
The image designed by Natalia Cano Murillo and colleagues shows the cross section of a ternary composite (boehmite/polycarbonate/epoxy, 80μm x 80μm). The surface was measured by AFM kelvin probe microscopy, yielding the surface potential which is shown as 3D‐surface and contour lines. The sample was further subjected to AFM force spectroscopy with a lateral resolution of 1μm², yielding the local Young's modulus, projected in false colors on the 3D surface. The ternary system, containing boehmite nanoparticles, shows a broad distribution of modulus, desirable for optimized macroscopic mechanical properties, such as high stiffness as well as toughness.
Main focus was on the correlation of the coefficient of friction (COF) with the geometrical parameters of the surface during early stage of the running-in period. TiN, TiAlN and AlTiN coatings were prepared by using rotating cathode arc evaporation unit. The roughness of the WC-Co substrate Ra ranged from 0.05 to 0.2 µm and the coating thickness was 2.3 ± 0.2 µm. Part of the samples were subjected to the surface modification by the drag grinding finishing. Geometrical parameters of the surface were evaluated by means of atomic force microscopy (AFM) and fretting tests were conducted with 10 mm diameter alumina ball under 2 N load, 100 µm slip distance and the frequency of 10 Hz. It was found that the distribution of macroparticles strongly influences the geometrical parameters of the surface and the number of macroparticles increases with increasing Al content in the coating. In the case of the positive skewness Ssq of the coating surface, the kurtosis Sku provides a statistically significant effect on the COF, namely the COF depends inversely on the kurtosis Sku. The kurtosis value for TiN was the highest among as-deposited coatings, subsequently, the slowest increase rate in the COF was observed for the TiN coating.
The concept behind this Research Topic (RT) was to collect works, in which Atomic Force Microscopy (AFM) techniques are employed to study tribological phenomena and to push the resolution of measurements towards single asperity contact. Thanks to the direct determination of sample height with sub-nanometer resolution and the possibility of measuring local friction, AFM can be employed after a tribotest to detect topography and friction changes at the nanometer scale. Recently, efforts are being expended to use AFM cantilevers as tribometers, i.e., as probes altering the volume of suitable samples, thereby measuring tip and/or sample wear and friction at the nano/microscale. Thus, single asperity contact, friction, and wear can be investigated. Since friction and wear at the macroscale are the result of asperities interactions, such experiments are of great importance for better understanding of tribological processes.
During focused ion beam microscopy (FIB) of crystalline materials imaging contrast and milling result are effected by orientation of the crystals with respect to the incident ion beam. This is due to the possibility of ion channeling along preferred crystal directions which effects the depth at which interaction between ions and specimen atoms takes place. As a result of channeling emission of ion induced secondary electrons (iiSE) and secondary ions (SI) as well as the sputter rate decreases.
Theoretical channeling orientations and critical angles can be calculated.
These effects have been studied quantitatively for polycrystalline recrystallized Cu as a typical model case.