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A new “green” and mild synthesis of highly stable microcrystalline Cs2AgxNa1-xBiyIn1-yCl6 (CANBIC) perovskites under ambient conditions was developed that is scalable to the multi-gram production. Under UV illumination, the CANBIC perovskites emit intense broadband photoluminescence (PL) with a quantum yield (QY) of 92% observed for x = 0.35 and y = 0.01-0.02. The combination of strong UV absorbance and broadband visible emission, high PL QY, and long PL lifetimes of up to 1.4 μs, along with an outstanding stability makes these CANBICs a promising material class for many optical applications.
The properties of the encapsulant are critical to the long-term performance of photovoltaic (PV) modules under the influence of sunlight including UV, elevated temperature, humidity and diffusion of oxygen. Encapsulation process represents a bout 40% of the whole PV module cost. The introduction of new non-EVA encapsulant material type "Low-Cost, High-Performance" should provide a solution to outdoor yellowing degradation problems. The emerging encapsulant materials exhibit a good compatibility with emerging PV solar cells for long term durability. This new generation of encapsulant materials has the advantage to improve e the PV module performances and long term durability for specific climate like desert regions. This scientific contribution presents an overview of the different encapsulant materials currently on the market, the general requirements of the emerging encapsulant materials and characterizations techniques for degradation, diagnostic and reliability lifetime estimation in the framework of Algerian renewable energy strategy.
The removal of a 75- to 90-nm-thick passivating silicon nitride antireflection coating from standard textured multicrystalline silicon photovoltaic wafers with a typical diffused 90-Ω/sq-emitter upon irradiation with near-infrared femtosecond laser pulses (790 nm central wavelength, 30 fs pulse duration) is studied experimentally. The laser irradiation areas are subsequently characterized by complementary optical microscopy, scanning electron microscopy and depth profiling chemical analyses using secondary ion mass spectrometry. The results clarify the thin-film femtosecond laser ablation scenario and outline the process windows for selective antireflection coating removal.
We report on the trace analysis of copper and iron impurities in multicrystalline silicon wafers with the microbeam X-ray fluorescence (µ-XRF) technique. The efficiency of solar cells, which are based on multicrystalline silicon wafers, is strongly influenced by minor contamination with metals such as copper and iron. Application of compound refractive lenses (CRLs) in µ-XRF allows versatile two-dimensional mapping of relevant contaminations and localization of their sites of deposition. In this context, the measured bulk average limit of detection (LOD) was one picogram of iron and copper per gram of silicon. We suggest that µ-XRF is a valuable tool for non-destructive spatial (3D) quantification of metal impurities in a wide range of materials and devices whose functioning could be critically affected by impurities.