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Paper des Monats
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Core-shell nanoparticles are widespread in nature, industrial applications and nanotechnology research. Facile ways of modern synthesis will be discussed and possibilities to reveal their structures with small-angle X-ray scattering (SAXS). A recent review on using block copolymer templates as one of the most reliable routes for tuning size and shape of nanoparticles is provided by Li et al.1 Ferritin and apoferritin are archetypical examples for protein-based core-shell nanoparticles. Their structures are easily accessed by synchrotron SAXS2 but also with commercial instruments and allow fast performance tests.3 SASfit4 is a suitable program tool based on classical curve fitting and McSAS5 is a complementary program based on a Monte Carlo technique. Detailed refinements of SAXS data evaluation are on the way for better data analysis.6 A sub nanometer resolution is state-of-the-art for quantification of the size distribution of polyacrylic acid stabilized silver nanoparticles.3 Such particles are useful in catalysis.7 It was observed that the catalytic activity can be tuned easily by varying the shell material of the particles.
Healable materials could play an important role in reducing the environmental footprint of our modern technological society through extending the life cycles of consumer products and constructions. Future technologies require smart materials with advanced properties including responsiveness to external stimuli and particularly the ability to autonomously repair inflicted damage. The introduction of reversible connections in the polymer architecture, either in a non-covalent fashion, such as in supramolecular polymers, or by using dynamic covalent chemistry. One facile approach involves the implementation of reversible polymer networks as they offer high mechanical strength and thermal properties that are readily modified by the nature of the connecting dynamic bonds and the crosslinking density. In this context, small-angle scattering allows a detailed insight into the network structure of self-healing polymers either in bulk materials or in form of hydrogels. Here we report on how small-angle scattering can contribute to reveal the network structure. A first example is the conditional repair by locally switching the thermal healing capability of dynamic covalent polymers with light.
Typical experimental SAXS curves of a photo- and thermal switchable polymer are shown. The scattering pattern show three characteristics. Region 1 is dominated by a forward scattering interpreted as resultant from large scale inhomogeneities of the bulk polymers (characterized by a first correlation length). The second scattering contribution can be interpreted as resultant from the network and is characterized by its entanglement distance. The mesh size of this network can be described by a second correlation length. Region 3 of the scattering pattern is dominated by a broad peak. Taking all effects into account, we approximate the total scattering as a sum of the three scattering contributions. In particular, the Debye-Büche function is used for I1 the Ornstein-Zernike function for the crosslinking contribution I2 and a Lorentzian peak function.
We discussed this simple and more sophisticated approaches for revealing network structures. Examples of studies from hydrogel networks are provided as important materials with polymeric networks in life science applications. Finally, the determination of mesh size distributions as a function of temperature, time and healing efficiency is discussed in detail.
In contrast to microplastics, little is known about nanoplastics (1 to 100 nm). In order to make the dectecability of nanoplasics more reliable, we started to develop nanoplastic reference materials. This project also aims to anser the question of how the single chain conformation of bio(polymers) changes in contact with nanoplastics. Small-angle X-ray and neutron scattering methods are suitable methods for studing this topic. Recently the soft and hard interactions between polystyrene nanoplasics and human serum albumin corona was investigated with small-angle neutron scattering. Here we concentrate on small-angle X-ray scattering as our favorite method to study how (bio)polymers change their conformation in contact with nanoplastics. The scattering of bovine serum albumin in its native state can be detected easily. The scattering pattern of this biopolymer changes dramatically when its globular stucture changes to a coil structure. Modeling of chain conformations and the calculation of the scattering pattern is relatively easy to perform. Numerous model calculations will be provided to predict the changes of conformation of single bio(polymer) chains when in conatact with nanoplastics. These predictions will be compared with recent experimenal results from in situ measurments of bio(polymers) in contact with nanoplastics. The impact of temperature, polymer concentration and salt on the single-chain conformation changes will be discussed.
A look inside nanoparticles
(2019)
Small-angle scattering is the method of choice when it comes to obtaining information about the interior of nanoparticles. The aim is to make nanotechnology safer. While the use of small-angle neutron scattering (SANS) is limited to a few instruments in the world, small-angle X-ray scattering (SAXS) is widely accessible, with an upward trend. The example of core-shell particles shows how simple their analysis is with data from an Anton Paar laboratory system. Here, SAXS is a central tool for the development of new reference materials based on poly(methyl) acrylate-PVDF core-shell particles. The dimensions of the cores and shells can be precisely determined. A detailed analysis makes it possible to show that the cores contain fluorinated and nonfluorinated polymers, whereas the shell consist only of PVDF. This core-shell particles with a diameter around 40 nm show a significantly higher PVDF beta phase content than the PVDF homopolymer when using an emulsion polymerization technique. This finding is of importance with respect to applications in electroactive devices.
Herein, we report three crystals of styryl quinoline derivatives. All these three crystals are mechanically flexible crystals, isostructural and also all of them comply with the common underlying features for elas- tic flexibility like absence of slip plane, criss-cross packing arrangement of neighbouring tapes, presence of weak and dispersive interactions such as halogen bonds, hydrogen bonds etc. The interactions facilitate easy movement of molecules under application of pressure thereby imparting elasticity. Further, the crys- tals were found to be blue light emitting making them promising candidates for optical waveguides. The optical properties were combined with flexibility by using crystal engineering approach towards achiev- ing various applications such as flexible OLEDs, optical waveguides, flexible optoelectronics etc.
The effects of weathering exposure on unfilled and filled thermoplastic polyurethanes (TPU) materials are described as performed under different humidity conditions. For this purpose, a weathering device was used with UV-A 340 nm lamps at a constant temperature of 40 °C. The effects of environmental (UV and humidity condition) degradation on the frictional properties of TPU materials are presented along with surface analyses to characterize the chemistry of the degradative process. Photooxidative degradation of unfilled polymer leads to deterioration of physical and mechanical properties, which affects its tribological behavior significantly. Due to crosslinking, the stiffness of the material increases, reducing drastically the friction coefficient of unfilled TPUs. The frictional behavior of glass fiber reinforced TPU is less affected by radiation.
The X-ray intensities of the K-, L- and M-lines of copper, zirconium and tungsten have been measured with an energy-dispersive X-ray spectrometer of known efficiency as function of photon energy. X-ray production efficiencies were determined from the measured intensities for Kα- and L-series of Cu and Zr and for the L- and M-series of W. These data were compared to calculated X-ray production efficiencies based on the widely used matrix correction models of Pouchou and Pichoir (XPP) and Bastin (PROZA96).
Our results indicate that a replacement of the stopping power in the PROZA96 algorithm by expressions of Joy and Jablonski has only a minor influence on the calculated X-ray production efficiencies. In contrast, the modifications of the ionization cross-section show a stronger effect. We replaced the ionization cross-sections for K lines of the PROZA96 algorithm with different models.
The results for L- and M-Lines are different. For the L-lines of Cu the original XPP and PROZA96 models show the best agreement while using the Bote cross-sections result in an overestimation. For the Zr-L and W-L1, -L2, -L3 X-ray production efficiencies, the Bote cross-sections lead to a significant improvement compared to all other models. The original XPP model represents the best agreement for the M5 efficiencies but underestimates the M4 efficiencies.
There is no superior model or modification because the parameter sets in the models need to be aligned to each other. However, using the ionization cross-sections of Bote, which are based on quantum mechanical calculations, show promising results in many cases.
Elemental composition and thickness determination of thin films by electron probe microanalysis
(2023)
Electron probe microanalysis (EPMA) applies to solid samples of homogenous (bulk) chemical composition and can usually not be applied to structures which are inhomogeneous in the micrometer range such as thin film systems down to a few nm. However, in combination with the established thin film software Stratagem, the thickness as well as the elemental composition of thin films on a substrate can be determined. This has been recently successfully demonstrated for Fe-Ni on Si and Si-Ge on Al2O3 thin film systems. For both systems five samples of different elemental composition and a reference were produced and characterised by inductively coupled plasma mass spectrometry (ICP-MS), Rutherford backscattering (RBS), and transmission electron microscopy (TEM) as reference values. Last year, a new and open-source thin film evaluation programme called BadgerFilm has been released. It can also be used to determine thin film composition and thickness from intensity ratios of the unknown sample and standards (k-ratios). In this contribution, we reevaluated the data acquired for the Fe-Ni and Si-Ge systems using the BadgerFilm software package and compared the obtained elemental compositions and thickness values with the results of the Stratagem software and the reference methods. The conclusion is that the BadgerFilm software shows good agreement with the elemental composition and thickness calculated by Stratagem (mostly <2% for both composition and thickness) and with the reference values for two representative thin film systems (<1%–2% for composition and <10%–20% for thickness).
The thickness of thin films can be measured by various methods, e.g., profilometry, ellipsometry, atomic force microscopy (AFM), or X-ray reflectometry. For the additional determination of thin film composition, techniques like X-ray photoelectron spectroscopy (XPS) or mass spectrometry-based techniques can be used. An alternative non-destructive technique is electron probe microanalysis (EPMA). This method assumes a sample of homogenous (bulk) chemical composition, so that it cannot be usually applied to thin film samples. However, in combination with the thin film software StrataGEM, the thickness as well as the composition of such films on a substrate can be determined.
This has been demonstrated for FeNi on Si and SiGe on Al2O3 film systems. For both systems five samples with different elemental composition and a reference were produced and characterised by Korean research institute KRISS using inductively coupled plasma mass spectrometry (ICP-MS), Rutherford backscattering (RBS), and transmission electron microscopy (TEM). These samples were used for an international round robin test.
In 2021, a new and open-source thin film evaluation programme called BadgerFilm has been released. It can also be used to determine thin film composition and thickness from intensity ratios of the unknown sample and standards (k-ratios).
In this contribution, we re-evaluated the data acquired for the FeNi and SiGe systems using the BadgerFilm software package and compared the resulting composition and thickness with the results of the established StrataGEM software and other reference methods. With the current evaluation, the BadgerFilm software shows good agreement with the composition and thickness calculated by StrataGEM and as the reference values provided by the KRISS.
Electron probe microanalysis (EPMA)is a non-destructive technique which assumes a sample of homogenous (bulk) chemical composition and can, therefore, not be used for thin film samples. However, in combination with one of the possible thin film software packages, STRATAGEM, the thickness as well as the composition of such films on a substrate can be determined.
This has been demonstrated for FeNi on Si and SiGe on Al2O3 film systems. For both systems five samples with different elemental composition and a reference were produced and characterised by the Korean research institute KRISS using inductively coupled plasma mass spectrometry (ICP-MS), Rutherford backscattering (RBS), and transmission electron microscopy (TEM).
In 2021, a new and open source thin film evaluation programme called BADGERFILM has been released. It can also be used to determine thin film composition and thickness from intensity ratios of the unknown sample and standards (k-ratios).
In this contribution, we re-evaluated the data acquired for the FeNi and SiGe systems using the BADGERFILM software package and compared the resulting composition and thickness with the results of the established STRATAGEM software and other reference methods. With the current evaluation, the BADGERFILM software shows good agreement with the composition and thickness calculated by STRATAGEM and provided by the KRISS.
These results between two well-known layered material systems analysed with available conventional EMPA approaches (STRATAGEM and direct thickness measurement by TEM) and a new one (BADGERFILM) proves that reliable non-destructive thin film analysis is possible. In this way, we validate the performance of the new software, which is not at all self-explanatory for such
complex quantification algorithms lying behind the final quantified results.