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- X-ray refraction topography (4) (entfernen)
Beyond classical X-ray techniques are used for the purpose of preferably short-term applications, but some supplementary X-ray and synchrotron techniques for higher resolution microdiagnostics take advantage of scattering effects. In contrast to directly imaging methods their resolution is only limited by the diffraction limit of the X-ray wavelength, far below the atomic dimensions. These techniques of scanning topography and refraction synchrotron tomography may permit the systematic diagnostics for finding and exploiting structure/property relations like correlations among atomic, nano and microstructures with macroscopic properties. Their basic advantage over microscopic techniques is their potential for the non-destructive characterisation of materials, far from invasive sample treatments. They combine scattering and spatial resolution.
Microstructural characterization of porous materials by two-dimensional X-ray refraction topography
(2004)
X-ray refraction topography determines the internal surfaces and interfaces of non-metallic porous materials within the range of namometer to micrometer dimensions. The method is based on refraction of X-rays caused by interfaces of microstructures in heterogeneous materials.
Generally, it permits a non-destructive full volume characterization of the pore topology. The X-ray refraction scanning technique make possible to visualize integral interface properties up to 10 μm spatial resolution by two-dimensional topographic images. It detects the spatially resolved internal surfaces of both, open and closed pores. Comparison to a certified powder reference of uniform grain size and known packing density reveals a quantitative measure for calibration requirements. An investigation on SiC- and Al2O3-ceramics illustrate the quantitative characterization of the internal surface density, pore sizes and their spatial distribution as well as local porosity fluctuations.