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In impact-echo testing of finite concrete structures, reflections of Rayleigh and body waves from lateral boundaries significantly affect time-domain signals and spectra. In the present paper we demonstrate by numerical simulations and experimental measurements at a concrete specimen that these reflections can lead to systematic errors in thickness determination. These effects depend not only on the dimensions of the specimen, but also on the location of the actual measuring point and on the duration of the detected time-domain signal.
A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study was to ensure the equivalency in the measurement capability of national metrology institutes for the thickness measurement of HfO2 films. In this pilot study, the thicknesses of six HfO2 films with nominal thickness from 1 nm to 4 nm were measured by X-ray Photoelectron Spectroscopy (XPS), X-ray Reflectometry(XRR), X-ray Fluorescence Analysis (XRF), Transmission Electron Spectroscopy (TEM), Spectroscopic Ellipsometry (SE) and Rutherford Backscattering Spectrometry (RBS). The reference thicknesses were determined by mutual calibration of a zero-offset method (Medium Energy Ion Scattering Spectroscopy (MEIS) of KRISS) and a method traceable to the length unit (the average thicknesses of three XRR data except the thinnest film). These reference thicknesses are traceable to the length unit because they are based on the traceability of XRR. For the thickness measurement by XPS, the effective attenuation length of Hf 4f electrons was determined. In the cases of XRR and TEM, the offset values were determined from a linear fitting between the reference thicknesses and the individual data by XRR and TEM. The amount of substance of HfO2, expressed as thickness of HfO2 films (in both linear and areal density units), was found to be a good subject for a CCQM key comparison.
To reach the main text of this paper, click on Final Report.
The final report has been peer-reviewed and approved for publication by the CCQM.
THz applications for NDT
(2017)
Electromagnetic waves in the frequency range between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials, to operate contactless and to be non-ionizing as well as be-ing insensitive to ambient temperatures makes THz technologies for NDT applications attractive especially where other techniques are not available or less suitable. Today T-rays are applied in non-destructive testing for quality control and condition monitoring issues. The operation is based on the combination of both transmission and/or reflection measurements and specially developed reconstruction procedures. Firstly, THz-TDS measurements will be presented to demonstrate the opportunities for spectroscopy and imaging of polymer materials. A SAFT algorithm and an Optical Layer-Model will be presented and discussed in more detail to demonstrate the opportunities of image reconstruction for visualization of the inner structures of op-tically and far infra-red opaque polymer composites.