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We report on photothermal detection of subsurface defects by coherent superposition of thermal wave fields. This is made possible by structured heating using high-power VCSEL laser arrays whose individual emitter groups can be arbitrarily controlled. In order to locate the defects, we have developed a scanning method based on the continuous wavelet transformation with complex Morlet wavelet using the destructive interference effect of thermal waves. This approach can also be used for thermally very fast and highly reflective materials such as uncoated aluminum. We show that subsurface defects at an aspect ratio of defect width to defect depth down to 1/3 are still detectable in this material.
Photothermal characterization of polyester composites loaded with parallelly arranged graphite rods
(2022)
One of the biggest challenges in the measurement of thermal properties is to measure inhomogeneous materials This work focuses on measuring the thermal properties of cylindrical polyester resin composite materials loaded with graphite rods oriented in the direction of the resin thickness, varying the graphite concentrations starting from zero to 8 75 of volumetric fraction and changing the distribution of graphite rods inside the polyester matrix
Time-resolved phase-contrast microscopy is employed to visualize spatio-temporal thermal transients induced by tight focusing of a single Ti:sapphire fs-laser pulse into a solid dielectric sample. This method relies on the coupling of the refractive index change and the sample temperature through the thermo-optic coefficient dn/dT. The thermal transients are studied on a timescale ranging from 10 ns up to 0.1 ms after laser excitation. Beyond providing direct insights into the laser–matter interaction, analyzing the results obtained also enables quantifying the local thermal diffusivity of the sample on a micrometer scale. Studies conducted in different solid dielectrics, namely amorphous fused silica (a-SiO2), a commercial borosilicate glass (BO33, Schott), and a custom alkaline earth silicate glass (NaSi66), illustrate the applicability of this approach to the investigation of various glassy materials.