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- Cu(In,Ga)Se2 (3) (entfernen)
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Light concentration opens up the path to enhanced material efficiency of solar cells via increased conversion efficiency and decreased material requirement. For true material saving, a fabrication method allowing local growth of high quality absorber material is essential. We present two scalable fs-laser based approaches for bottom-up growth of Cu(In,Ga)Se2 micro islands utilizing either site-controlled assembly of In(,Ga) droplets on laser-patterned substrates during physical vapor deposition, or laser-induced forward transfer of (Cu,In,Ga) layers for local precursor arrangement. The Cu(In,Ga)Se2 absorbers formed after selenization can deliver working solar devices showing efficiency enhancement under light concentration.
Thin film solar cells made of Cu(In,Ga)Se2 (CIGSe) suffer from high costs, since the rare elements indium and gallium are used for a multitude of technical applications. The concept of micro-concentrator CIGSe solar cells allows substantial material saving. Therefore a reliable bottom up process for the preparation of the absorber islands is required. In addition, this also results in an increase of solar cell efficiency. We show that the indium islands can be grown at predefined locations by novel methods of surface treatment before indium deposition. By this, regular island patterns with a well-defined morphology have been obtained. The controlled deposition of copper, followed by selenization in a PVD system, and selective etching of copper selenides yields polycrystalline CIGSe micro islands with promising material properties. For the samples, we proof ways to place a non-conducting layer in between CIGSe islands to insulate the front and back contact. This layer is obtained by spin-coating and curing a novolak based resist. At first, the photovoltaic active absorber islands is completely covered by the resin. The top of the islands can be stripped by plasma etching for front contacting. A characterization of the obtained devices provided evidence for their functionality.
The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits.