Femtosecond vs. Nanosecond Laser-induced XUV Spectroscopy (LIXS)

  • In contrast to laser-induced breakdown spectroscopy (LIBS), measuring after a delay as long as a few microseconds, laser-induced XUV spectroscopy (LIXS) takes advantage of emissions from the very first instant of the pristine plasma. This process exhibits stable and intense line and recombination emissions in the XUV-range. Therefore, common challenges for precise measurements (e.g. quantification efforts) in LIBS caused by signal intensity fluctuations due to matrix effects and plasma-flicker noise are improved, as shown for ns-pulses. A femtosecond laser (pulse length ~100 fs) interacts fundamentally different with matter than a nanosecond laser. Of the many photons needed for ionization of the sample, less are absorbed via inverse Bremsstrahlung and more in a Franck-Condon multiphoton absorption (MPA) process. In combination with the higher peak power, and therefore higher initial plasma temperature (> 10 eV), atoms are selectively ionized to a higher degree while at the same timeIn contrast to laser-induced breakdown spectroscopy (LIBS), measuring after a delay as long as a few microseconds, laser-induced XUV spectroscopy (LIXS) takes advantage of emissions from the very first instant of the pristine plasma. This process exhibits stable and intense line and recombination emissions in the XUV-range. Therefore, common challenges for precise measurements (e.g. quantification efforts) in LIBS caused by signal intensity fluctuations due to matrix effects and plasma-flicker noise are improved, as shown for ns-pulses. A femtosecond laser (pulse length ~100 fs) interacts fundamentally different with matter than a nanosecond laser. Of the many photons needed for ionization of the sample, less are absorbed via inverse Bremsstrahlung and more in a Franck-Condon multiphoton absorption (MPA) process. In combination with the higher peak power, and therefore higher initial plasma temperature (> 10 eV), atoms are selectively ionized to a higher degree while at the same time thermal dissipation and equilibration is reduced. This specificity in excitation leads to a reduced background and the highly ionized atoms overwhelmingly emit the desired XUV-radiation. Thus, fs-LIXS promises to lead to “cleaner” spectra with sharper separation of the emission lines. The capabilities of a fs-LIXS setup in comparison to ns-LIXS will be discussed. Samples of pure elements (Al, Si, Ni, Fe, Mg), as well as composite samples (CaF, LiF, PTFE, polypropylene) serve as model systems to demonstrate these capabilities.zeige mehrzeige weniger

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Autor*innen:Simon Blume
Koautor*innen:Dávid Jenö Palasti, Davide Bleiner, Jens Riedel
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2026
Organisationseinheit der BAM:1 Analytische Chemie; Referenzmaterialien
1 Analytische Chemie; Referenzmaterialien / 1.3 Instrumentelle Analytik
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Elemental analysis; Femtosecond; LIXS; XUV
Themenfelder/Aktivitätsfelder der BAM:Chemie und Prozesstechnik
Chemie und Prozesstechnik / Chemische Charakterisierung und Spurenanalytik
Veranstaltung:EMSLIBS 2025
Veranstaltungsort:Senlis, France
Beginndatum der Veranstaltung:26.01.2026
Enddatum der Veranstaltung:30.01.2026
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:06.02.2026
Referierte Publikation:Nein
Eingeladener Vortrag (wissenschaftliche Konferenzen):Nein
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