Measurement of Lateral Size of Graphene Oxide Flakes by SEM - An Update of the VAMAS TWA 41 Project P13
- The progress of the VAMAS interlaboratory comparison Project P13 "Lateral size of graphene oxide flakes by SEM" within the Technical Working Area 41 "Graphene and Related 2D Materials" is presented. The challenges at sample preparation on substrates for accurate measurement and image analysis as well as two different image analysis approaches, containing exact guidance how to measure the main descriptors for the lateral size measurement of the imaged graphene oxide flakes with Scanning Electron Microscopy are described. Discrepancies are explained. The inclusion of the results into the corresponding ISO technical specification CD/TS 23879 is also discussed and planned, in relation with the AFM part.
| Autor*innen: | L. Ren, A. Pollard, Vasile-Dan HodoroabaORCiD |
|---|---|
| Dokumenttyp: | Vortrag |
| Veröffentlichungsform: | Präsentation |
| Sprache: | Englisch |
| Jahr der Erstveröffentlichung: | 2025 |
| Organisationseinheit der BAM: | 6 Materialchemie |
| 6 Materialchemie / 6.1 Oberflächen- und Dünnschichtanalyse | |
| DDC-Klassifikation: | Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten |
| Freie Schlagwörter: | Electron microscopy; Graphene oxide flakes; Interlaboratory comparison; Lateral size; VAMAS |
| Themenfelder/Aktivitätsfelder der BAM: | Material |
| Material / Advanced Materials | |
| Veranstaltung: | Versailles Project on Advanced Materials and Standards (VAMAS) 50th Steering Committee Meeting |
| Veranstaltungsort: | London, United Kingdom |
| Beginndatum der Veranstaltung: | 15.09.2025 |
| Enddatum der Veranstaltung: | 19.09.2025 |
| URL: | https://www.vamas.org/twa41/documents/2023_vamas_twa41_project13_GO_SEM.pdf |
| Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
| Datum der Freischaltung: | 30.09.2025 |
| Referierte Publikation: | Nein |
| Eingeladener Vortrag (wissenschaftliche Konferenzen): | Nein |

