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Flexible anisotropic magnetoresistive sensors for novel eddy current testing applications

  • The standard method for eddy current testing (ET) of conductive materials relies on using rigid coils. In recent years magnetoresistive (MR) sensors in combination with an excitation wire have become a promising candidate for this application since it would increase the spatial resolution. New developments in flexible electronics have enabled the production of flexible sensors with the novel capability of scanning samples in conformal contact with the surface. In this article flexible anisotropic magnetoresistive (AMR) sensors were used in combination with a thin induction wire to perform eddy current testing of a curved aluminum sample with several defects imprinted on its surface. To benchmark the performance of this new method, a flat sample with reference defects of various dimensions was also scanned using flexible AMR sensors, inductive coils and rigid giant magnetoresistive (GMR) sensors. The results show that this new method of using flexible magnetic field sensors coupled withThe standard method for eddy current testing (ET) of conductive materials relies on using rigid coils. In recent years magnetoresistive (MR) sensors in combination with an excitation wire have become a promising candidate for this application since it would increase the spatial resolution. New developments in flexible electronics have enabled the production of flexible sensors with the novel capability of scanning samples in conformal contact with the surface. In this article flexible anisotropic magnetoresistive (AMR) sensors were used in combination with a thin induction wire to perform eddy current testing of a curved aluminum sample with several defects imprinted on its surface. To benchmark the performance of this new method, a flat sample with reference defects of various dimensions was also scanned using flexible AMR sensors, inductive coils and rigid giant magnetoresistive (GMR) sensors. The results show that this new method of using flexible magnetic field sensors coupled with an excitation wire can easily be applied to the scanning of curved samples, while in the benchmark test employing the flat sample, the performance is not far behind more conventional techniques, with defects with depths down to 30 μm and widths down to 400 μm being detectable with an SNR of 3 (signal magnitude) and 8 (signal phase shift) at the excitation frequency of 50 kHz, and defects with depths down to 30 μm and widths down to 600 μm being detectable with an SNR of 10 (signal magnitude) and 17 (signal phase shift) at 260 kHz.zeige mehrzeige weniger

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Metadaten
Autor*innen:Alberto NicoliceaORCiD, E. S. Oliveros-Mata, D. Makarov, Michael MelzerORCiD, Matthias Pelkner
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Journal of the International Measurement Confederation (IMEKO)
Jahr der Erstveröffentlichung:2025
Organisationseinheit der BAM:8 Zerstörungsfreie Prüfung
8 Zerstörungsfreie Prüfung / 8.1 Sensorik, mess- und prüftechnische Verfahren
8 Zerstörungsfreie Prüfung / 8.4 Akustische und elektromagnetische Verfahren
Veröffentlichende Institution:Bundesanstalt für Materialforschung und -prüfung (BAM)
Verlag:Elsevier
Verlagsort:Amsterdam
Jahrgang/Band:253, Part A
Aufsatznummer:117340
Erste Seite:1
Letzte Seite:15
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Defect detection; Eddy current testing; Flexible electronics; Flexible magnetic field sensors; Magnetic field sensors; Magnetism; Non-destructive testing; Thin film sensor fabrication
Themenfelder/Aktivitätsfelder der BAM:Umwelt
DOI:10.1016/j.measurement.2025.117340
URN:urn:nbn:de:kobv:b43-634325
ISSN:1873-412X
Verfügbarkeit des Dokuments:Datei für die Öffentlichkeit verfügbar ("Open Access")
Lizenz (Deutsch):License LogoCreative Commons - CC BY - Namensnennung 4.0 International
Datum der Freischaltung:19.06.2025
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:19.06.2025
Schriftenreihen ohne Nummerierung:Wissenschaftliche Artikel der BAM
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