Validated and standardized measurements and quantification of surface functionalities on nanoparticles

  • Surface-functionalized organic and inorganic engineered nanomaterials (NMs) are widely applied in the life and materials sciences. NM performance depends on key factors such as particle size and shape, crystal phase, morphology, chemical composition, and surface chemistry, i.e., surface coatings, functional groups (FGs), and ligands.1 The latter controls their processability and interaction with the environment and largely their possible toxicity. Thus, methods for FG quantification are important tools for quality control of NM production processes and can foster the sustainable development of functional and safe(r) NMs. This underlines the importance of validated and standardized analytical methods for surface analysis and reference materials.2 This encouraged us to explore simple and versatile tools for quantifying common bioanalytically relevant FGs such as optical assays, electrochemical titration methods, quantitative nuclear magnetic resonance spectroscopy (qNMR), and X-RaySurface-functionalized organic and inorganic engineered nanomaterials (NMs) are widely applied in the life and materials sciences. NM performance depends on key factors such as particle size and shape, crystal phase, morphology, chemical composition, and surface chemistry, i.e., surface coatings, functional groups (FGs), and ligands.1 The latter controls their processability and interaction with the environment and largely their possible toxicity. Thus, methods for FG quantification are important tools for quality control of NM production processes and can foster the sustainable development of functional and safe(r) NMs. This underlines the importance of validated and standardized analytical methods for surface analysis and reference materials.2 This encouraged us to explore simple and versatile tools for quantifying common bioanalytically relevant FGs such as optical assays, electrochemical titration methods, quantitative nuclear magnetic resonance spectroscopy (qNMR), and X-Ray photoelectron spectroscopy (XPS) and to perform a first interlaboratory comparison (ILC) on surface FG quantification.3,4 In a follow-up ILC, BAM and NRC explored qNMR sample preparation, measurement, and data evaluation protocols for commercial and custom-made aminated SiO2 NPs with sizes of 20-100 nm, different amounts of surface amino FGs, and different porosity.5,6 First, the number of amino FGs accessible for a dye reporter was determined with a cost-efficient, automated optical fluorescamine assay. Then, qNMR workflows and protocols were stepwise fine-tuned. The qNMR ILC was complemented by joint XPS measurements. BAM also examined the applicability of fast and automatable potentiometric titrations to screen the total amount of (de)protonable FGs on aminated SiO2 NPs. Our results underline the need to evaluate protocols for FG quantification in ILCs and the advantages of multi-method characterization strategies for efficient method cross validation.zeige mehrzeige weniger

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  • Presentation_SmurfNano_Overview_SAWG.pdf
    eng
  • Abstract_CCQM SAWG_Surface Analysis of NMs.pdf
    eng

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Autor*innen:Isabella TavernaroORCiD, Sarah-Luise AbramORCiD, Christian Homann, Lena Scholtz, Jörg RadnikORCiD, Ute Resch-GengerORCiD
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2025
Organisationseinheit der BAM:1 Analytische Chemie; Referenzmaterialien
1 Analytische Chemie; Referenzmaterialien / 1.2 Biophotonik
6 Materialchemie
6 Materialchemie / 6.1 Oberflächen- und Dünnschichtanalyse
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Calibration; Digital certificate; Fluorescence; Metrology; Nano; Particle; Potentiometry; QNMR; Quality assurance; Reference data; Reference material; Reference product; Surface analysis; Traceability; XPS
Themenfelder/Aktivitätsfelder der BAM:Chemie und Prozesstechnik
Chemie und Prozesstechnik / Chemische Charakterisierung und Spurenanalytik
Material
Material / Advanced Materials
Material / Materialdesign
Umwelt
Veranstaltung:Surface and Micro/Nano Analysis Working Group
Veranstaltungsort:Paris, France
Beginndatum der Veranstaltung:08.04.2025
Enddatum der Veranstaltung:09.04.2025
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:16.04.2025
Referierte Publikation:Nein
Eingeladener Vortrag (wissenschaftliche Konferenzen):Nein
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