Exploring the SIMS Matrix Effect in High-Entropy Alloy Thin-Films
- Compared with traditional alloys, which typically consist of one or two main elements and small amounts of secondary elements, High Entropy Alloys (HEA) are characterized by the presence of multiple principal elements in almost equal proportions. This unique composition results in a high degree of disorder at the atomic level, leading to exceptional mechanical, physical, and often unexpected properties. HEAs have garnered significant attention in materials science and engineering due to their potential applications in a wide range of industries, from aerospace and automotive to electronics and renewable energy.
Analyzing materials composed of multiple elements with spectroscopic techniques such as X-ray Photoelectron Spectroscopy (XPS), Auger-Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA), can be challenging due to spectral overlap. This challenge reaches its peak if neighboring 3d elements are present, as it is the case for the famous Cantor alloy which isCompared with traditional alloys, which typically consist of one or two main elements and small amounts of secondary elements, High Entropy Alloys (HEA) are characterized by the presence of multiple principal elements in almost equal proportions. This unique composition results in a high degree of disorder at the atomic level, leading to exceptional mechanical, physical, and often unexpected properties. HEAs have garnered significant attention in materials science and engineering due to their potential applications in a wide range of industries, from aerospace and automotive to electronics and renewable energy.
Analyzing materials composed of multiple elements with spectroscopic techniques such as X-ray Photoelectron Spectroscopy (XPS), Auger-Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA), can be challenging due to spectral overlap. This challenge reaches its peak if neighboring 3d elements are present, as it is the case for the famous Cantor alloy which is composed of Cr, Mn, Fe, Co and Ni. Moreover, each analytical method introduces its own set of challenges, e.g., the strong secondary fluorescence effect for neighbor elements in EPMA, thus, making the accurate elemental quantification in such materials difficult. If the material is available as thin film, additional constraints are inherently present. To provide a reference material for these analytical challenges HEAs are excellent candidates. Currently, there is no thin film reference available containing more than two elements.
Our goal is to prepare thin films with a homogeneous thickness and defined, homogenous chemical composition to be analyzed by various methods dedicated to surface analysis.
ToF-SIMS is an excellent method for the (3D) analysis of thin films, however due to the dependence of element ion yield on the surrounding chemical state i.e., the matrix effect, it is considered a non-quantitative method. In HEAs the elements are each present in a homogenous matrix which makes these materials interesting for investigation of the matrix effect. Moreover, we evaluate methods to minimize the disturbances of oxygen enhancement during the beginning of the sputter analysis and the effect of recoil mixing at the film/substrate interface with the aim to measure accurate depth profiles.…


| Autor*innen: | Elisabeth JohnORCiD |
|---|---|
| Koautor*innen: | Matthias Weise, Mario SahreORCiD, Jörg Manfred StockmannORCiD, Thorid Lange, Jörg RadnikORCiD, Vasile-Dan HodoroabaORCiD |
| Dokumenttyp: | Posterpräsentation |
| Veröffentlichungsform: | Präsentation |
| Sprache: | Englisch |
| Jahr der Erstveröffentlichung: | 2024 |
| Organisationseinheit der BAM: | 6 Materialchemie |
| 6 Materialchemie / 6.1 Oberflächen- und Dünnschichtanalyse | |
| DDC-Klassifikation: | Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten |
| Freie Schlagwörter: | High-entropy alloy; Matrix Effect; ToF-SIMS |
| Themenfelder/Aktivitätsfelder der BAM: | Material |
| Material / Advanced Materials | |
| Veranstaltung: | SIMS 24 |
| Veranstaltungsort: | La Rochelle, France |
| Beginndatum der Veranstaltung: | 09.09.2024 |
| Enddatum der Veranstaltung: | 13.09.2024 |
| Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
| Datum der Freischaltung: | 06.02.2025 |
| Referierte Publikation: | Nein |

