The characterization of oxygen diffusion in (Na1/2Bi1/2)TiO3 piezo-ceramics by Time-of-Flight secondary ion mass spectrometry (ToF-SIMS)

  • The ferroelectric ceramic NBT and its solid solutions with barium titanate (BT) are examples for the most promising lead free materials to substitute the dominant Pb(Zr,Ti)O3 (PZT). Lead based material should generally be disregarded due to environmental and health reasons. However, there is no class of lead-free piezoelectric materials that can replace PZT entirely. Not only the often inferior ferroelectric properties but also the lack of understanding of the defect chemistry of NBT is still a challenge for the replacement of lead containing piezo-ceramics. Just recently it could be shown by Li et al.[1] that NBT obtains extraordinarily high oxygen ionic conductivity when doped with Mg as acceptor. It was actually expected that doping just leads to a hardening of the ferroelectric properties. However, it became clear that the known defect chemical behavior of PZT cannot be extrapolated to NBT materials. Hence, to gain information on general doping effects a better defect chemicalThe ferroelectric ceramic NBT and its solid solutions with barium titanate (BT) are examples for the most promising lead free materials to substitute the dominant Pb(Zr,Ti)O3 (PZT). Lead based material should generally be disregarded due to environmental and health reasons. However, there is no class of lead-free piezoelectric materials that can replace PZT entirely. Not only the often inferior ferroelectric properties but also the lack of understanding of the defect chemistry of NBT is still a challenge for the replacement of lead containing piezo-ceramics. Just recently it could be shown by Li et al.[1] that NBT obtains extraordinarily high oxygen ionic conductivity when doped with Mg as acceptor. It was actually expected that doping just leads to a hardening of the ferroelectric properties. However, it became clear that the known defect chemical behavior of PZT cannot be extrapolated to NBT materials. Hence, to gain information on general doping effects a better defect chemical investigation is needed. This is particularly important for the applications with high reliability demands to investigate possible degradation and fatigue mechanisms. In the present work Time-of-flight-secondary ion mass spectrometry (ToF-SIMS) was used in order to observe the influence of different acceptor dopants (Fe, Ni, Al) on the oxygen diffusion in NBT. ToF-SIMS holds the ability to gain a full elemental distribution in a sub-micron resolution and was therefore chosen to provide the essential information on the favorable diffusion paths of oxygen in NBT in dependence of the chosen doping element. 18O was used as a tracer for oxygen as its natural abundance is only 0.2%. The doped NBT samples have been annealed for 5 h at 500°C in a 0.2 bar 18O-tracer atmosphere to be able to detect oxygen ion diffusion. ToF-SIMS investigations were conducted on a ToF-SIMS IV (ION TOF GmbH, Münster, Germany) using a Bi+ primary ion beam (25KeV in collimated burst alignment mode with a beam diameter of ~150 nm) and a Cs+ sputter beam (3KeV). The results illustrate the different impact of dopants on the diffusion properties which is evidence for a highly non-linear dependence on dopant type and concentration. 1) Li, M., et al., Nature Materials, 2014. 13(1): p. 31-35.zeige mehrzeige weniger

Volltext Dateien herunterladen

  • Poster SIMS21 - 01092017.pdf
    eng

Metadaten exportieren

Weitere Dienste

Teilen auf Twitter Suche bei Google Scholar Anzahl der Zugriffe auf dieses Dokument
Metadaten
Autor*innen:Oded SobolORCiD
Koautor*innen:S. Steiner, K. Albe, T. Froemling, Wolfgang Unger
Dokumenttyp:Posterpräsentation
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2017
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:NBT-Piezoceramics; ToF-SIMS
Veranstaltung:21st International Conference on Secondary Ion Mass Spectrometry - SIMS21
Veranstaltungsort:Krakow, Poland
Beginndatum der Veranstaltung:10.09.2017
Enddatum der Veranstaltung:15.09.2017
URL:http://sims.confer.uj.edu.pl/boa_poster.php?id=93
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:16.11.2017
Referierte Publikation:Nein
Einverstanden
Diese Webseite verwendet technisch erforderliche Session-Cookies. Durch die weitere Nutzung der Webseite stimmen Sie diesem zu. Unsere Datenschutzerklärung finden Sie hier.