THz applications for NDT
- Electromagnetic waves in the frequency range between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials, to operate contactless and to be non-ionizing as well as be-ing insensitive to ambient temperatures makes THz technologies for NDT applications attractive especially where other techniques are not available or less suitable. Today T-rays are applied in non-destructive testing for quality control and condition monitoring issues. The operation is based on the combination of both transmission and/or reflection measurements and specially developed reconstruction procedures. Firstly, THz-TDS measurements will be presented to demonstrate the opportunities for spectroscopy and imaging of polymer materials. A SAFT algorithm and an Optical Layer-Model will be presented and discussed in more detail to demonstrate the opportunities of image reconstruction for visualization of the inner structures of op-tically and far infra-red opaque polymerElectromagnetic waves in the frequency range between 0.1 and 10 THz are described as THz-radiation (T-ray). The ability to penetrate dielectric materials, to operate contactless and to be non-ionizing as well as be-ing insensitive to ambient temperatures makes THz technologies for NDT applications attractive especially where other techniques are not available or less suitable. Today T-rays are applied in non-destructive testing for quality control and condition monitoring issues. The operation is based on the combination of both transmission and/or reflection measurements and specially developed reconstruction procedures. Firstly, THz-TDS measurements will be presented to demonstrate the opportunities for spectroscopy and imaging of polymer materials. A SAFT algorithm and an Optical Layer-Model will be presented and discussed in more detail to demonstrate the opportunities of image reconstruction for visualization of the inner structures of op-tically and far infra-red opaque polymer composites.…


| Autor*innen: | Jörg Beckmann |
|---|---|
| Koautor*innen: | Holger Spranger, Uwe Ewert |
| Dokumenttyp: | Vortrag |
| Veröffentlichungsform: | Präsentation |
| Sprache: | Englisch |
| Jahr der Erstveröffentlichung: | 2017 |
| DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
| Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten | |
| Freie Schlagwörter: | Dielectric materials; Image reconstruction; THz radiation; Terahertz synthetic aperture focusing; Thickness measurements |
| Veranstaltung: | 2017 Far East Forum On Nondestructive Evaluation/Testing: New Technology & Application |
| Veranstaltungsort: | XI'an, China |
| Beginndatum der Veranstaltung: | 22.06.2017 |
| Enddatum der Veranstaltung: | 24.06.2017 |
| Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
| Datum der Freischaltung: | 29.06.2017 |
| Referierte Publikation: | Nein |
| Eingeladener Vortrag (wissenschaftliche Konferenzen): | Nein |

