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X-ray back scatter techniques for additive manufacturing

  • X-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. More than 20 years ago the company Philips developed “COMSCAN”, a first application case for aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. The principle is to scan the object with a highly collimated X-ray needle beam from one side only and to detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ inspection in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projectionsX-ray back scatter imaging is rarely applied compared to classical X-ray projection imaging. More than 20 years ago the company Philips developed “COMSCAN”, a first application case for aircraft industry, which allowed even a depth resolution using back scatter imaging. The company AS&E in Boston offers back scatter imaging solutions for the security market. The principle is to scan the object with a highly collimated X-ray needle beam from one side only and to detect the backscattered radiation by a large area detector side by side with the collimation wheel. A new prototype is investigated at BAM for application and optimization in non-destructive testing. As modern industrial application field in-situ inspection in additive manufacturing is targeted. The accessibility of the printed part during the production process is very limited. This prevent the application of a two sided X-ray inspection or Computed Tomography, were an rotation of the object is required to acquire projections from 360 degrees. An important advantage for the X-ray back scatter technique are also the materials used in additive manufacturing (polymers, ceramics, light metals like Aluminum or Titanium). These materials with lower density and lower Z values give better scatter signals than metals with higher densities and Z values. The back scatter intensity decreases with increasing density and Z value of the material. But the requirements on spatial resolution and contrast sensitivity are more stringent for non-destructive testing of additive manufactured parts compared to the security area. In NDT sizes of indications smaller than 1 mm have to be detected clearly. The investigation of these limits on a state-of-the-art prototype for X-ray back scattering using rotating collimated X-ray needle beams is a part of the BAM project “ProMoAM”. The contribution shows first results of the optimization for NDT and the achieved application limits for several example cases.zeige mehrzeige weniger

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Metadaten
Autor*innen:Uwe ZscherpelORCiD
Koautor*innen:Maryam Nazarzadehmoafi, Mingshuan Yuan, Anja Waske
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2019
Organisationseinheit der BAM:8 Zerstörungsfreie Prüfung
8 Zerstörungsfreie Prüfung / 8.0 Abteilungsleitung und andere
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Additive Manufacturing; Non-destructive testing; X-ray back scattering
Themenfelder/Aktivitätsfelder der BAM:Chemie und Prozesstechnik
Veranstaltung:International Symposium on Nondestructive Characterization of Materials
Veranstaltungsort:Portoroz, Slovenia
Beginndatum der Veranstaltung:17.09.2019
Enddatum der Veranstaltung:19.09.2019
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:09.03.2020
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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