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Broadband dielectric spectroscopy on miscible polymer blends in the bulk and in nanometer thick films - Comparison of the different confinement situations

  • Broadband dielectric spectroscopy in the frequency range from 10-1 to 109 Hz is employed to revisit the segmental dynamics of the miscible blend system poly(vinyl methyl ether)/polystyrene (PVME/PS) in dependence on the composition firstly in the bulk state. Here especially the case of high polystyrene concentrations is considered. It is important to note that only the molecular dynamics of PVME segments as affected by PS is observed because the dipole moment of polystyrene is negligible. Three relaxation processes are found which are due to fluctuations of differently constrained or confined PVME segments. The degree of the confinement of PVME segments due to PS is discussed in dependence on the composition. Further a spatial confinement is considered by investigating thin films of the PVME/PS blend where the film thickness was varied from 100 nm down to 5 nm. Two concentrations of PVME/PS (50/50 wt% and 25/75 wt%) are investigated. To measure nanometer thick films a novel electrodeBroadband dielectric spectroscopy in the frequency range from 10-1 to 109 Hz is employed to revisit the segmental dynamics of the miscible blend system poly(vinyl methyl ether)/polystyrene (PVME/PS) in dependence on the composition firstly in the bulk state. Here especially the case of high polystyrene concentrations is considered. It is important to note that only the molecular dynamics of PVME segments as affected by PS is observed because the dipole moment of polystyrene is negligible. Three relaxation processes are found which are due to fluctuations of differently constrained or confined PVME segments. The degree of the confinement of PVME segments due to PS is discussed in dependence on the composition. Further a spatial confinement is considered by investigating thin films of the PVME/PS blend where the film thickness was varied from 100 nm down to 5 nm. Two concentrations of PVME/PS (50/50 wt% and 25/75 wt%) are investigated. To measure nanometer thick films a novel electrode system based on nanostructured electrodes was employed. Nanostructured electrodes can be considered as a cut-edge technology in dielectric spectroscopy. The relaxation spectra of the films showed multiple processes which are discussed in dependence on the film thickness.zeige mehrzeige weniger

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Metadaten
Autoren/innen:Paulina Szymoniak, Andreas Schönhals
Koautoren/innen:Sherif Madkour
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2019
Organisationseinheit der BAM:6 Materialschutz und Oberflächentechnik
6 Materialschutz und Oberflächentechnik / 6.6 Nano-Tribologie und Nanostrukturierung von Oberflächen
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Polymer blends
Themenfelder/Aktivitätsfelder der BAM:Material
Material / Materialien und Stoffe
Material / Nanoskalige Materialien und deren Eigenschaften
Veranstaltung:Spring Meeting of the American Physical Scociety
Veranstaltungsort:Boston, Ma, USA
Beginndatum der Veranstaltung:03.03.2019
Enddatum der Veranstaltung:08.03.2019
Verfügbarkeit des Volltexts:Volltext-PDF im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:11.03.2019
Referierte Publikation:Nein