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Simulation-aided computed tomography (CT) for dimensional measurements

  • Carrying out dimensional measurements by CT means assessing coordinates in space. CT must therefore be treated as a coordinate measuring technique similar to optical or tactile Coordinate Measuring Machines (CMMs). The well-established standards and guidelines for the acceptance- and verificationtesting of CMMs require the use of calibrated reference standards to achieve measurement machine characteristics. Hence, transferring these concepts from coordinate metrology to CT, a dedicated CT-specific reference standard was designed, manufactured and calibrated using a tactile CMM. For comparison purposes, a CAD model was created by reverse engineering using the calibration data. The calibrated model was fed into a virtual CT and the measurement process was simulated. The reference standard was measured by micro-CT. By comparing the characteristics of the measurement output of CT and the output gained from simulation, the influences of measurement artefacts can be judged, for the firstCarrying out dimensional measurements by CT means assessing coordinates in space. CT must therefore be treated as a coordinate measuring technique similar to optical or tactile Coordinate Measuring Machines (CMMs). The well-established standards and guidelines for the acceptance- and verificationtesting of CMMs require the use of calibrated reference standards to achieve measurement machine characteristics. Hence, transferring these concepts from coordinate metrology to CT, a dedicated CT-specific reference standard was designed, manufactured and calibrated using a tactile CMM. For comparison purposes, a CAD model was created by reverse engineering using the calibration data. The calibrated model was fed into a virtual CT and the measurement process was simulated. The reference standard was measured by micro-CT. By comparing the characteristics of the measurement output of CT and the output gained from simulation, the influences of measurement artefacts can be judged, for the first time, in analogy to existing Guidelines of coordinate metrology.zeige mehrzeige weniger

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Metadaten
Autor*innen:U. Hilpert, M. Bartscher, M. Neugebauer, Jürgen Goebbels, Gerd Weidemann, Carsten BellonORCiD
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Graue Literatur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):DIR 2007 - International Symposium on Digital Industrial Radiology and Computed Tomography (Proceedings)
Jahr der Erstveröffentlichung:2007
Erste Seite:Paper 6, 1
Letzte Seite:15
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Freie Schlagwörter:Computed tomography; Coordinate metrology; Simulation; X-ray
Veranstaltung:DIR 2007 - International Symposium on Digital industrial Radiology and Computed Tomography
Veranstaltungsort:Lyon, France
Beginndatum der Veranstaltung:25.06.2007
Enddatum der Veranstaltung:27.06.2007
URL:http://www.ndt.net/article/dir2007/papers/12.pdf
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:04.08.2016
Referierte Publikation:Nein
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