High Speed X-ray Imaging and Spectroscopy with pnCCDs: XRF, XRD and PIXE measurements (and others)
- For many years pnCCDs have been well known as X-ray detectors for spectroscopic imaging in many fields of science: X-Ray Fluorescence analysis (XRF), X-ray Diffraction (XRD) with light sources in large accelerator facilities as well as with laboratory light sources or with X-rays from celestial sources in X-ray astronomy. A brief introduction in GEXRF (Grazing Emission XRF) measurements with a laboratory laser produced plasma source will be given, PIXE (Particle Induced X-ray Emission) measurements and D2XRF (Double Dispersive X-Ray Fluorescence) and Slicing experiments with pnCCDs coupled to polycapillary optics performed at the BESSY synchrotron will be shown. Energy-dispersive Laue diffraction with ultra-hard X-rays for the analysis of defects in metals will conclude the overview of spectroscopic X-ray imaging measurements in the field of structure and dynamics of matter.
Autor*innen: | L. Strüder |
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Koautor*innen: | P. Holl, R. Hartmann, D. Schlosser, J. Davis, J. Schmidt, M. Huth, D. Kolak, Martin RadtkeORCiD, S. Nowak, A. Renno, J. Grenzer, A. Abboud, U. Pietsch, H. Soltau |
Dokumenttyp: | Vortrag |
Veröffentlichungsform: | Präsentation |
Sprache: | Englisch |
Jahr der Erstveröffentlichung: | 2016 |
DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
Freie Schlagwörter: | BAMline; PIXE; PnCCD; Synchrotron; XRD; XRF |
Veranstaltung: | Microscopy & Microanalysis 2016 Meeting |
Veranstaltungsort: | Columbus, Ohio, USA |
Beginndatum der Veranstaltung: | 24.07.2016 |
Enddatum der Veranstaltung: | 28.07.2016 |
Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
Datum der Freischaltung: | 04.01.2017 |
Referierte Publikation: | Nein |
Eingeladener Vortrag: | Nein |