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Correction of diffuse X-ray detector based background
- A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background Signals (backlight) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation Phase and the samples aspect ratio (dynamics). The magnitude of the diffuse Background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shaded area and the stronger the total attenuation. Moreover, theA novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background Signals (backlight) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation Phase and the samples aspect ratio (dynamics). The magnitude of the diffuse Background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shaded area and the stronger the total attenuation. Moreover, the local intensity mismatch depends on the attenuation of the sample. We present very basic reference data measured with multiple metal foils at a synchrotron radiation source. Beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure assumes a constant (non-local) scattering mechanism.…
Autor*innen: | Axel Lange, Manfred P. Hentschel, Andreas KupschORCiD, Bernd R. MüllerORCiD |
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Dokumenttyp: | Beitrag zu einem Tagungsband |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | DIR 2011 - International symposium on digital industrial raidology and computed tomography (Proceedings) |
Jahr der Erstveröffentlichung: | 2011 |
Veröffentlichende Institution: | Bundesanstalt für Materialforschung und -prüfung (BAM) |
Verlag: | Deutsche Gesellscahft für Zerstörungsfreie Prüfung e.V. (DGZfP) |
Ausgabe/Heft: | DGZfP-BB 128 (Poster 24) |
Erste Seite: | 1 |
Letzte Seite: | 7 |
Freie Schlagwörter: | Backlight; Computed tomography; Fluorescence screen; Synchrotron radiography; X-ray detector |
Veranstaltung: | DIR 2011 - International symposium on digital industrial raidology and computed tomography |
Veranstaltungsort: | Berlin, Germany |
Beginndatum der Veranstaltung: | 20.06.2011 |
Enddatum der Veranstaltung: | 22.06.2011 |
URN: | urn:nbn:de:kobv:b43-243589 |
ISBN: | 978-3-940283-34-4 |
Verfügbarkeit des Dokuments: | Datei für die Öffentlichkeit verfügbar ("Open Access") |
Lizenz (Deutsch): | Creative Commons - Namensnennung-Keine Bearbeitung |
Datum der Freischaltung: | 31.12.2015 |
Referierte Publikation: | Nein |
Schriftenreihen ohne Nummerierung: | Wissenschaftliche Artikel der BAM |