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Quantitative simulation of back scatter X-ray imaging and comparison to experiments
- X-ray backscatter imaging is a well established NDT technique to inspect complex objects using only a single-sided access. In difference to conventional transmission X-ray radiography, the X-ray backscatter imaging utilizes the scattered radiation caused by the Compton scattering effect. In order to achieve high backscatter intensities from a test object, it is necessary to optimize the backscatter system parameters namely the angle between source and slit camera, the slit collimator system, the shielding between source and scatter camera, and the type of detector. In addition, the scatter phenomena in to the investigated object need to be understood. In this contribution, we present a Monte Carlo model McRay which considers all relevant single and multiple interactions of photons and electrons. This model can be used to simulate back scatter techniques. It allows not only calculating the scatter image for a given experimental setup but also registering the spectrum of the detectedX-ray backscatter imaging is a well established NDT technique to inspect complex objects using only a single-sided access. In difference to conventional transmission X-ray radiography, the X-ray backscatter imaging utilizes the scattered radiation caused by the Compton scattering effect. In order to achieve high backscatter intensities from a test object, it is necessary to optimize the backscatter system parameters namely the angle between source and slit camera, the slit collimator system, the shielding between source and scatter camera, and the type of detector. In addition, the scatter phenomena in to the investigated object need to be understood. In this contribution, we present a Monte Carlo model McRay which considers all relevant single and multiple interactions of photons and electrons. This model can be used to simulate back scatter techniques. It allows not only calculating the scatter image for a given experimental setup but also registering the spectrum of the detected scattered photons. Both aspects are important to understand the imaging process, to interpret the results, and to optimize the backscatter camera investigated here. Additionally experimental results will be presented and compared with simulations.…
Autor*innen: | Gerd-Rüdiger Jaenisch, Sanjeevareddy Kolkoori, Carsten BellonORCiD |
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Dokumenttyp: | Beitrag zu einem Tagungsband |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | Proceedings of the 19th World Conference on Nondestructive Testing |
Jahr der Erstveröffentlichung: | 2016 |
Veröffentlichende Institution: | Bundesanstalt für Materialforschung und -prüfung (BAM) |
Verlag: | Deutsche Gesellschaft für zerstörungsfreie Prüfung (DGZfP) |
Verlagsort: | Berlin, Germany |
Jahrgang/Band: | 158 |
Erste Seite: | 1 |
Letzte Seite: | 11 |
DDC-Klassifikation: | Naturwissenschaften und Mathematik / Chemie / Analytische Chemie |
Freie Schlagwörter: | Back-scatter techniques; Measurements; Monte Carlo methods; Radiology; Simulation |
Veranstaltung: | 19th World Conference on Nondestructive Testing |
Veranstaltungsort: | Munich, Germany |
Beginndatum der Veranstaltung: | 13.06.2016 |
Enddatum der Veranstaltung: | 17.06.2016 |
URN: | urn:nbn:de:kobv:b43-365897 |
ISBN: | 978-3-940283-78-8 |
Verfügbarkeit des Dokuments: | Datei für die Öffentlichkeit verfügbar ("Open Access") |
Lizenz (Deutsch): | Creative Commons - Namensnennung-Keine Bearbeitung |
Datum der Freischaltung: | 21.06.2016 |
Referierte Publikation: | Nein |
Schriftenreihen ohne Nummerierung: | Wissenschaftliche Artikel der BAM |