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On the interplay of microstructure and residual stress in LPBF IN718

  • The relationship between residual stresses and microstructure associated with a laser powder bed fusion (LPBF) IN718 alloy has been investigated on specimens produced with three different scanning strategies (unidirectional Y-scan, 90° XY-scan, and 67° Rot-scan). Synchrotron X-ray energy-dispersive diffraction (EDXRD) combined with optical profilometry was used to study residual stress (RS) distribution and distortion upon removal of the specimens from the baseplate. The microstructural characterization of both the bulk and the nearsurface regions was conducted using scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD). On the top surfaces of the specimens, the highest RS values are observed in the Y-scan specimen and the lowest in the Rot-scan specimen, while the tendency is inversed on the side lateral surfaces. A considerable amount of RS remains in the specimens after their removal from the baseplate, especially in the Y- and Z-direction (short specimenThe relationship between residual stresses and microstructure associated with a laser powder bed fusion (LPBF) IN718 alloy has been investigated on specimens produced with three different scanning strategies (unidirectional Y-scan, 90° XY-scan, and 67° Rot-scan). Synchrotron X-ray energy-dispersive diffraction (EDXRD) combined with optical profilometry was used to study residual stress (RS) distribution and distortion upon removal of the specimens from the baseplate. The microstructural characterization of both the bulk and the nearsurface regions was conducted using scanning electron microscopy (SEM) and electron backscatter diffraction (EBSD). On the top surfaces of the specimens, the highest RS values are observed in the Y-scan specimen and the lowest in the Rot-scan specimen, while the tendency is inversed on the side lateral surfaces. A considerable amount of RS remains in the specimens after their removal from the baseplate, especially in the Y- and Z-direction (short specimen Dimension and building direction (BD), respectively). The distortion measured on the top surface following baseplate thinning and subsequent removal is mainly attributed to the amount of RS released in the build direction. Importantly, it is observed that the additive manufacturing microstructures challenge the use of classic theoretical models for the calculation of diffraction elastic constants (DEC) required for diffraction-based RS analysis. It is found that when the Reuß model is used for the calculation of RS for different crystal planes, as opposed to the conventionally used Kröner model, the results exhibit lower scatter. This is discussed in context of experimental measurements of DEC available in the literature for conventional and additively manufactured Ni-base alloys.zeige mehrzeige weniger

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Metadaten
Autoren/innen:Itziar Serrano-Munoz, Tobias Fritsch, Tatiana Mishurova, Anton Trofimov, D. Apel, Alexander Ulbricht, Arne Kromm, René Hesse, Alexander Evans, Giovanni Bruno
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Journal of Material Science
Jahr der Erstveröffentlichung:2020
Organisationseinheit der BAM:8 Zerstörungsfreie Prüfung
8 Zerstörungsfreie Prüfung / 8.5 Mikro-ZfP
9 Komponentensicherheit
9 Komponentensicherheit / 9.4 Integrität von Schweißverbindungen
Veröffentlichende Institution:Bundesanstalt für Materialforschung und -prüfung (BAM)
Verlag:Springer
Erste Seite:1
Letzte Seite:25
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Distortion upon baseplate removal; Effect of scanning strategies; L-PBF IN718 material; Near-surface X-ray diffraction; Residual stress in AM
Themenfelder/Aktivitätsfelder der BAM:Material
Material / Materialien und Stoffe
DOI:https://doi.org/10.1007/s10853-020-05553-y
URN:urn:nbn:de:kobv:b43-519460
ISSN:0022-2461
Verfügbarkeit des Dokuments:Datei für die Öffentlichkeit verfügbar ("Open Access")
Lizenz (Deutsch):License LogoCreative Commons - CC BY - Namensnennung 4.0 International
Datum der Freischaltung:06.01.2021
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:14.01.2021
Schriftenreihen ohne Nummerierung:Wissenschaftliche Artikel der BAM