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In-depth structural and chemical characterization of engineered TiO2 films

  • Analytical routines for a comprehensive in-depth morphological, structural, and chemical characterization of functionalized TiO2 films by using different state-of-the-art analytical techniques are presented and discussed with the main objective to identify potential reference TiO2 coating parameters able to be certified at a later stage. TiO2 films fabricated by two different synthetic procedures as representative for two main large-scale applications were selected: (i) pulsed d.c. magnetron sputtering for photocatalytic applications and (ii) screen printing from preformed anatase nanoparticles. The screen-printed films were further loaded with a sensitizing dye for application as a dye-sensitized solar cell. Film properties such as microstructure and crystallographic texture of pulsed d.c. magnetron sputtering synthesized films were systematically studied by means of scanning nanobeam electron diffraction in a transmission electron microscope and the surface and inner morphology byAnalytical routines for a comprehensive in-depth morphological, structural, and chemical characterization of functionalized TiO2 films by using different state-of-the-art analytical techniques are presented and discussed with the main objective to identify potential reference TiO2 coating parameters able to be certified at a later stage. TiO2 films fabricated by two different synthetic procedures as representative for two main large-scale applications were selected: (i) pulsed d.c. magnetron sputtering for photocatalytic applications and (ii) screen printing from preformed anatase nanoparticles. The screen-printed films were further loaded with a sensitizing dye for application as a dye-sensitized solar cell. Film properties such as microstructure and crystallographic texture of pulsed d.c. magnetron sputtering synthesized films were systematically studied by means of scanning nanobeam electron diffraction in a transmission electron microscope and the surface and inner morphology by scanning electron microscopy. The dye distribution over the depth of screen-printed TiO2 layers was analyzed before and after dye-loading by means of energy dispersive X-ray spectroscopy at scanning electronmicroscope, Auger electron spectroscopy and time-of-flight secondary ion mass spectrometry. The long-term goal of the present study is the improvement of quality of the TiO2 film parameters as measured by using different types of reference TiO2 coatings having specific parameters certified.zeige mehrzeige weniger

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Metadaten
Autoren/innen:Erik Ortel, Ines Häusler, Werner ÖsterleORCiD, S. Narbey, F. Oswald, I. H. Andersen, Markus Holzweber, Wolfgang Unger, Vasile-Dan Hodoroaba
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Surface and Interface Analysis
Jahr der Erstveröffentlichung:2016
Organisationseinheit der BAM:5 Werkstofftechnik
5 Werkstofftechnik / 5.1 Materialographie, Fraktographie und Alterung technischer Werkstoffe
6 Materialschutz und Oberflächentechnik
6 Materialschutz und Oberflächentechnik / 6.1 Oberflächenanalytik und Grenzflächenchemie
Verlag:John Wiley & Sons, Ltd.
Jahrgang/Band:48
Erste Seite:664
Letzte Seite:669
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Crystallinity; Depth profiling; Line scan; Mapping; Ru dye sensitizer; TiO2 films
Themenfelder/Aktivitätsfelder der BAM:Material
Material / Materialien und Stoffe
Analytical Sciences
Analytical Sciences / Oberflächen- und Grenzflächenanalytik
Veranstaltung:16th European Conference on Applications of Surface and Interface Analysis ECASIA'15
Veranstaltungsort:Granada, Spain
Beginndatum der Veranstaltung:28.09.2015
Enddatum der Veranstaltung:01.10.2015
DOI:https://doi.org/10.1002/sia.5966
URL:http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS&DestLinkType=FullRecord;UT=WOS:000379680000059
ISSN:0142-2421
ISSN:1096-9918
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:07.07.2016
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:05.08.2016