• Treffer 20 von 45
Zurück zur Trefferliste

Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) imaging of deuterium assisted cracking in a 2205 duplex stainless steel microstructure

  • In the present work, the influence of deuterium on the microstructure of a duplex stainless steel type EN 1.4462 has been characterized by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) supported by scanning electron microscopy (SEM), focused ion beam (FIB), electron back scattered diffraction(EBSD) and energy dispersive x-ray (EDX) investigations. Characterization has been carried out before and after electrochemical charging with deuterium which has been used as a tracer, due to its similar behavior to hydrogen in the steel microstructure. In a first approach, the distribution of the deuterium occurring at temperatures above � 58 °C has been visualized. Further it turned out that sub-surface micro blisters are formed in the ferrite-austenite interface, followed by the formation of needle shaped plates and subsequent cracking at the ferrite surface. In the austenite phase, parallel cracking alongside twins and hexagonal close packed (martensitic) regions has been observed.In the present work, the influence of deuterium on the microstructure of a duplex stainless steel type EN 1.4462 has been characterized by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) supported by scanning electron microscopy (SEM), focused ion beam (FIB), electron back scattered diffraction(EBSD) and energy dispersive x-ray (EDX) investigations. Characterization has been carried out before and after electrochemical charging with deuterium which has been used as a tracer, due to its similar behavior to hydrogen in the steel microstructure. In a first approach, the distribution of the deuterium occurring at temperatures above � 58 °C has been visualized. Further it turned out that sub-surface micro blisters are formed in the ferrite-austenite interface, followed by the formation of needle shaped plates and subsequent cracking at the ferrite surface. In the austenite phase, parallel cracking alongside twins and hexagonal close packed (martensitic) regions has been observed. In both phases and even in the apparent interface, cracking has been associated with high deuterium concentrations, as compared to the surrounding undamaged microstructure. Sub-surface blistering in the ferrite has to be attributed to the accumulation and recombination of deuterium at the ferrite-austenite interface underneath the respective ferrite grains and after fast diffusing through this phase. Generally, the present application of chemometric imaging and structural analyses allows characterization of hydrogen assisted degradation at a sub-micron lateral resolution.zeige mehrzeige weniger

Volltext Dateien herunterladen

  • Sobol_et_al - ToF-SIMS imaging of deuterium assisted cracking in a 2205 duplex stainless steel microstructure.pdf
    eng

Metadaten exportieren

Weitere Dienste

Teilen auf Twitter Suche bei Google Scholar
Metadaten
Autoren/innen:Oded Sobol, Gerald Holzlechner, Gert Nolze, Thomas Wirth, D. Eliezer, Thomas Böllinghaus, Wolfgang Unger
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Materials Science & Engineering A
Jahr der Erstveröffentlichung:2016
Organisationseinheit der BAM:5 Werkstofftechnik
5 Werkstofftechnik / 5.1 Materialographie, Fraktographie und Alterung technischer Werkstoffe
6 Materialschutz und Oberflächentechnik
6 Materialschutz und Oberflächentechnik / 6.1 Oberflächenanalytik und Grenzflächenchemie
9 Komponentensicherheit
9 Komponentensicherheit / 9.0 Abteilungsleitung und andere
Verlag:Elsevier B.V.
Jahrgang/Band:676
Erste Seite:271
Letzte Seite:277
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:EBSD; FIB; Hydrogen assisted cracking; Hydrogen embrittlement; SEM; ToF-SIMS
Themenfelder/Aktivitätsfelder der BAM:Material
Analytical Sciences
DOI:https://doi.org/10.1016/j.msea.2016.08.107
URL:http://www.sciencedirect.com/science/article/pii/S0921509316310334
URL:http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=Alerting&SrcApp=Alerting&DestApp=WOS&DestLinkType=FullRecord;UT=WOS:000384853000031
ISSN:0921-5093
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:08.09.2016
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:03.11.2016