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Synchrotron radiation-based nano-FTIR spectroscopy for the characterization of chlorine gas corrosion of different silicon carbides

  • Near-field optical techniques such as nano-FTIR spectroscopy enable spectroscopic characterization of samples with a high sensitivity and a spatial resolution at the nanoscale. In this work we realized nano-FTIR spectroscopy by elastic scattering of infrared light from a probe tip of an atomic force microscope operated in tapping mode, with broadband infrared synchrotron radiation provided by the Metrology Light Source (MLS). We apply this technique to characterize the protective oxidation layers of different Silicon Carbides (SiCs) treated by chlorine gas. The process using chlorine-donors has been developed to separate toxic heavy metals from sewage sludge ash (SSA) and to increase the plant-availability of phosphors in the SSA in order to produce P-fertilizers. Nitrified SiC showed the highest resistant strength against chlorine corrosion at 1000 °C compared to the other SiCs. In order to discuss this behavior high resolution imaging has been performed on the interfacial layerNear-field optical techniques such as nano-FTIR spectroscopy enable spectroscopic characterization of samples with a high sensitivity and a spatial resolution at the nanoscale. In this work we realized nano-FTIR spectroscopy by elastic scattering of infrared light from a probe tip of an atomic force microscope operated in tapping mode, with broadband infrared synchrotron radiation provided by the Metrology Light Source (MLS). We apply this technique to characterize the protective oxidation layers of different Silicon Carbides (SiCs) treated by chlorine gas. The process using chlorine-donors has been developed to separate toxic heavy metals from sewage sludge ash (SSA) and to increase the plant-availability of phosphors in the SSA in order to produce P-fertilizers. Nitrified SiC showed the highest resistant strength against chlorine corrosion at 1000 °C compared to the other SiCs. In order to discuss this behavior high resolution imaging has been performed on the interfacial layer between bulk-SiC and the protective oxidation layer on sub-micrometer scale. The formation of a SixNiyO protective layer, which might be the reason for the higher corrosion resistance, was observed using nano-FTIR spectroscopy.zeige mehrzeige weniger

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Metadaten
Autor*innen:B. Kästner
Koautor*innen:Christian Vogel, P. Hermann, Burkart Adamczyk, A. Hoehl, G. Ulm, Christian Adam
Dokumenttyp:Vortrag
Veröffentlichungsform:Präsentation
Sprache:Englisch
Jahr der Erstveröffentlichung:2017
DDC-Klassifikation:Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Sanitär- und Kommunaltechnik; Umwelttechnik
Freie Schlagwörter:Corrosion science; Nano-FTIR spectroscopy; Phosphorus recovery
Veranstaltung:WIRMS2017
Veranstaltungsort:Oxford, UK
Beginndatum der Veranstaltung:25.09.2017
Enddatum der Veranstaltung:28.09.2017
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:10.10.2017
Referierte Publikation:Nein
Eingeladener Vortrag:Nein
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