Giovanni Bruno, Karsten Ehrig, Holger Haarring, Michael Harwardt, Manfred P. Hentschel, Bernhard Illerhaus, Andreas Kupsch, Axel Lange, Dietmar Meinel, Bernd R. Müller, Yener Onel, Andreas Staude, Thomas Wolk
- The combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive toThe combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive to internal interfaces.…
MetadatenAutor*innen: | Giovanni BrunoORCiD, Karsten Ehrig, Holger Haarring, Michael Harwardt, Manfred P. Hentschel, Bernhard Illerhaus, Andreas KupschORCiD, Axel Lange, Dietmar Meinel, Bernd R. MüllerORCiD, Yener Onel, Andreas Staude, Thomas Wolk |
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Dokumenttyp: | Beitrag zu einem Tagungsband |
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Veröffentlichungsform: | Verlagsliteratur |
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Sprache: | Englisch |
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Titel des übergeordneten Werkes (Englisch): | Conference on Industrial Computed Tomography (ICT) 2014 - Proceedings |
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Jahr der Erstveröffentlichung: | 2014 |
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Herausgeber (Institution): | FH Oberösterreich |
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Verlag: | Shaker |
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Verlagsort: | Aachen |
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Erste Seite: | 15 |
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Letzte Seite: | 31 |
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Freie Schlagwörter: | Complex microstructure; Quantitative image analysis; Statistical analysis; X-ray absorption and refraction CT |
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Veranstaltung: | iCT Conference 2014 - Conference on industrial computed tomography |
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Veranstaltungsort: | Wels, Austria |
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Beginndatum der Veranstaltung: | 25.02.2014 |
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Enddatum der Veranstaltung: | 28.02.2014 |
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ISBN: | 978-3-8440-2557-6 |
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Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
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Datum der Freischaltung: | 20.02.2016 |
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Referierte Publikation: | Nein |
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