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A Novel Multi Slit X-Ray Backscatter Camera Based on Synthetic Aperture Focusing

  • A special slit collimator was developed earlier for fast acquisition of X-ray back scatter images. The design was based on a twisted slit design (ruled surfaces) in a Tungsten block to acquire backscatter images. The comparison with alternative techniques as flying spot and coded aperture pin hole technique could not prove the expected higher contrast sensitivity. In analogy to the coded aperture technique, a novel multi slit camera was designed and tested. Several twisted slits were parallelly arranged in a metal block. The CAD design of different multi-slit cameras was evaluated and optimized by the computer simulation packages aRTist and McRay. The camera projects a set of equal images, one per slit, to the digital detector array, which are overlaying each other. Afterwards, the aperture is corrected based on a deconvolution algorithm to focus the overlaying projections into a single representation of the object. Furthermore, a correction of the geometrical distortions due to theA special slit collimator was developed earlier for fast acquisition of X-ray back scatter images. The design was based on a twisted slit design (ruled surfaces) in a Tungsten block to acquire backscatter images. The comparison with alternative techniques as flying spot and coded aperture pin hole technique could not prove the expected higher contrast sensitivity. In analogy to the coded aperture technique, a novel multi slit camera was designed and tested. Several twisted slits were parallelly arranged in a metal block. The CAD design of different multi-slit cameras was evaluated and optimized by the computer simulation packages aRTist and McRay. The camera projects a set of equal images, one per slit, to the digital detector array, which are overlaying each other. Afterwards, the aperture is corrected based on a deconvolution algorithm to focus the overlaying projections into a single representation of the object. Furthermore, a correction of the geometrical distortions due to the slit geometry is performed. The expected increase of the contrast-to-noise ratio is proportional to the square root of the number of parallel slits in the camera. However, additional noise has to be considered originating from the deconvolution operation. The slit design, functional principle, and the expected limits of this technique are discussed.zeige mehrzeige weniger

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Metadaten
Autor*innen:Frank Wieder, Uwe Ewert, Justus Vogel, Gerd-Rüdiger Jaenisch, Carsten BellonORCiD
Dokumenttyp:Beitrag zu einem Tagungsband
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):43rd Annual review of progress in quantitative nondestructive evaluation
Jahr der Erstveröffentlichung:2017
Herausgeber (Institution):American institute of physics (AIP)
Verlag:AIP Publishing
Jahrgang/Band:1806
Aufsatznummer:130002
Erste Seite:1
Letzte Seite:9
DDC-Klassifikation:Naturwissenschaften und Mathematik / Chemie / Analytische Chemie
Technik, Medizin, angewandte Wissenschaften / Ingenieurwissenschaften / Ingenieurwissenschaften und zugeordnete Tätigkeiten
Freie Schlagwörter:Aperture focusing; Back scatter imaging; Computer simulation; Deconvolution
Veranstaltung:43rd Annual Review of Progress in QNDE
Veranstaltungsort:Atlanta, GA, USA
Beginndatum der Veranstaltung:17.07.2016
Enddatum der Veranstaltung:22.07.2016
DOI:10.1063/1.4974711
ISBN:978-0-7354-1474-7
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:10.10.2017
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:10.10.2017
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