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Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurement techniques: an interlaboratory comparison study

  • Results of an interlaboratory comparison on size characterization of SiO2 airborne nanoparticles using on-line and off-line measurement techniques are discussed. This study was performed in the framework of Technical Working Area (TWA) 34—'Properties of Nanoparticle Populations' of the Versailles Project on Advanced Materials and Standards (VAMAS) in the project no. 3 'Techniques for characterizing size distribution of airborne nanoparticles'. Two types of nano-aerosols, consisting of (1) one population of nanoparticles with a mean diameter between 30.3 and 39.0 nm and (2) two populations of non-agglomerated nanoparticles with mean diameters between, respectively, 36.2–46.6 nm and 80.2–89.8 nm, were generated for characterization measurements. Scanning mobility particle size spectrometers (SMPS) were used for on-line measurements of size distributions of the produced nano-aerosols. Transmission electron microscopy, scanning electron microscopy, and atomic force microscopy were used asResults of an interlaboratory comparison on size characterization of SiO2 airborne nanoparticles using on-line and off-line measurement techniques are discussed. This study was performed in the framework of Technical Working Area (TWA) 34—'Properties of Nanoparticle Populations' of the Versailles Project on Advanced Materials and Standards (VAMAS) in the project no. 3 'Techniques for characterizing size distribution of airborne nanoparticles'. Two types of nano-aerosols, consisting of (1) one population of nanoparticles with a mean diameter between 30.3 and 39.0 nm and (2) two populations of non-agglomerated nanoparticles with mean diameters between, respectively, 36.2–46.6 nm and 80.2–89.8 nm, were generated for characterization measurements. Scanning mobility particle size spectrometers (SMPS) were used for on-line measurements of size distributions of the produced nano-aerosols. Transmission electron microscopy, scanning electron microscopy, and atomic force microscopy were used as off-line measurement techniques for nanoparticles characterization. Samples were deposited on appropriate supports such as grids, filters, and mica plates by electrostatic precipitation and a filtration technique using SMPS controlled generation upstream. The results of the main size distribution parameters (mean and mode diameters), obtained from several laboratories, were compared based on metrological approaches including metrological traceability, calibration, and evaluation of the measurement uncertainty. Internationally harmonized measurement procedures for airborne SiO2 nanoparticles characterization are proposed.zeige mehrzeige weniger

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Autor*innen:C. Motzkus, T. Macé, F. Gaie-Levrel, S. Ducourtieux, A. Delvallee, K. Dirscherl, Vasile-Dan HodoroabaORCiD, I. Popov, I. Kuselman, O. Popov, K. Takahata, K. Ehara, P. Ausset, M. Maillé, N. Michielsen, S. Bondiguel, F. Gensdarmes, L. Morawska, G.R. Johnson, E.M. Faghihi, C.S. Kim, Y.H. Kim, M.C. Chu, J.A. Guardado, A. Salas, G. Capannelli, C. Costa, T. Bostrom, A.K. Jämting, M.A. Lawn, L. Adlem, S. Vaslin-Reimann
Dokumenttyp:Zeitschriftenartikel
Veröffentlichungsform:Verlagsliteratur
Sprache:Englisch
Titel des übergeordneten Werkes (Englisch):Journal of nanoparticle research
Jahr der Erstveröffentlichung:2013
Verlag:Kluwer
Verlagsort:Dordrecht
Jahrgang/Band:15
Ausgabe/Heft:1919
Erste Seite:1
Letzte Seite:36
Freie Schlagwörter:Atomic force microscopy; Interlaboratory comparison; Metrological traceability; Scanning and transmission electron microscopies; Scanning mobility particle size spectrometers; SiO2 nano-aerosol size distribution
DOI:10.1007/s11051-013-1919-4
ISSN:1388-0764
ISSN:1572-896X
Verfügbarkeit des Dokuments:Datei im Netzwerk der BAM verfügbar ("Closed Access")
Datum der Freischaltung:20.02.2016
Referierte Publikation:Ja
Datum der Eintragung als referierte Publikation:24.10.2013
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