Orientation-distribution mapping of polycrystalline materials by Raman microspectroscopy
- Raman microspectroscopy provides the means to obtain local orientations on polycrystalline materials at the submicrometer level. The present work demonstrates how orientation-distribution maps composed of Raman intensity distributions can be acquired on large areas of several hundreds of square micrometers. A polycrystalline CuInSe2 thin film was used as a model system. The orientation distributions are evidenced by corresponding measurements using electron backscatter diffraction (EBSD) on the same identical specimen positions. The quantitative, local orientation information obtained by means of EBSD was used to calculate the theoretical Raman intensities for specific grain orientations, which agree well with the experimental values. The presented approach establishes new horizons for Raman microspectroscopy as a tool for quantitative, microstructural analysis at submicrometer resolution.
Autor*innen: | Thomas SchmidORCiD, N. Schäfer, S. Levcenko, T. Rissom, D. Abou-Ras |
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Dokumenttyp: | Zeitschriftenartikel |
Veröffentlichungsform: | Verlagsliteratur |
Sprache: | Englisch |
Titel des übergeordneten Werkes (Englisch): | Scientific reports |
Jahr der Erstveröffentlichung: | 2015 |
Verlag: | Nature Publishing Group |
Verlagsort: | London |
Jahrgang/Band: | 5 |
Erste Seite: | Article 18410, 1 |
Letzte Seite: | 7 |
DOI: | 10.1038/srep18410 |
ISSN: | 2045-2322 |
Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
Datum der Freischaltung: | 20.02.2016 |
Referierte Publikation: | Ja |
Datum der Eintragung als referierte Publikation: | 07.01.2016 |