A. Rack, T. Weitkamp, I. Zanette, C. Morawe, A. Vivo Rommeveaux, P. Tafforeau, P. Cloetens, E. Ziegler, T. Rack, A. Cecilia, P. Vagovic, E. Harmann, R. Dietsch, Heinrich Riesemeier
- Larger spectral bandwidth and higher photon flux density are the major advantages of multilayer monochromators over crystal-based devices. Especially for synchrotron-based hard X-ray microimaging applications the increased photon flux density is important in order to achieve high contrast and resolution in space and/or time. However, the modifications on the beam profile induced by reflection on a multilayer are a drawback which can seriously harm the performance of such a monochromator. A recent study [A. Rack, T. Weitkamp, M. Riotte, D. Grigoriev, T. Rack, L. Helfen, T. Baumbach, R. Dietsch, T. Holz, M. Krämer, F. Siewert, M. Meduna, P. Cloetens, E. Ziegler, J. Synchrotron Radiat. 17 (2010) 496510] has shown that the modifications in terms of beam flatness and coherence preservation can be influenced via the material composition of the multilayer coating. The present article extends this knowledge by studying further material compositions used on a daily basis for hard X-rayLarger spectral bandwidth and higher photon flux density are the major advantages of multilayer monochromators over crystal-based devices. Especially for synchrotron-based hard X-ray microimaging applications the increased photon flux density is important in order to achieve high contrast and resolution in space and/or time. However, the modifications on the beam profile induced by reflection on a multilayer are a drawback which can seriously harm the performance of such a monochromator. A recent study [A. Rack, T. Weitkamp, M. Riotte, D. Grigoriev, T. Rack, L. Helfen, T. Baumbach, R. Dietsch, T. Holz, M. Krämer, F. Siewert, M. Meduna, P. Cloetens, E. Ziegler, J. Synchrotron Radiat. 17 (2010) 496510] has shown that the modifications in terms of beam flatness and coherence preservation can be influenced via the material composition of the multilayer coating. The present article extends this knowledge by studying further material compositions used on a daily basis for hard X-ray monochromatization at the beamline ID19 of the European Synchrotron Radiation Facility.…
MetadatenAutor*innen: | A. Rack, T. Weitkamp, I. Zanette, C. Morawe, A. Vivo Rommeveaux, P. Tafforeau, P. Cloetens, E. Ziegler, T. Rack, A. Cecilia, P. Vagovic, E. Harmann, R. Dietsch, Heinrich Riesemeier |
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Dokumenttyp: | Zeitschriftenartikel |
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Veröffentlichungsform: | Verlagsliteratur |
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Sprache: | Englisch |
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Titel des übergeordneten Werkes (Englisch): | Nuclear instruments and methods in physics research A |
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Jahr der Erstveröffentlichung: | 2011 |
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Verlag: | Elsevier B.V. |
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Verlagsort: | Amsterdam |
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Jahrgang/Band: | 649 |
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Ausgabe/Heft: | 1 |
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Erste Seite: | 123 |
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Letzte Seite: | 127 |
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Freie Schlagwörter: | Coherence; Multilayer mirrors; Synchrotron radiation; X-ray imaging; X-ray monochromators; X-ray optics; X-ray phase contrast; X-rays |
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DOI: | 10.1016/j.nima.2010.11.069 |
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ISSN: | 0168-9002 |
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ISSN: | 0167-5087 |
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Verfügbarkeit des Dokuments: | Datei im Netzwerk der BAM verfügbar ("Closed Access") |
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Datum der Freischaltung: | 19.02.2016 |
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Referierte Publikation: | Ja |
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Datum der Eintragung als referierte Publikation: | 05.01.2012 |
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